RDL Package Structure with Encapsulant Recess for Adhesion
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Solution Overview
Problem
The semiconductor industry faces challenges in achieving high integration density and compact packaging of electronic components due to limitations in reducing feature size and packaging efficiency, particularly in the formation of reliable and compact 3D packaging structures that enhance adhesion and prevent water permeation.
Innovation Solution
The method involves forming a package structure with a redistribution layer (RDL) and encapsulant that includes a recess and extending part, where the encapsulant extends into the RDL structure, increasing contact area and enhancing adhesion, and using a combination of polymer and conductive materials to create a robust and compact package with improved reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional packaging methods are used, then manufacturing simplicity is maintained, but integration density and compactness are limited
Solution Approach 1:
The encapsulant includes a recess that receives and nests the adhesive layer and die assembly, creating a compact nested structure where multiple components occupy overlapping spatial volumes. This nesting approach enables higher integration density without proportionally increasing the package footprint.
Solution Approach 2:
The patent transitions from traditional 2D planar packaging to 3D vertical packaging by stacking the die, adhesive layer, and encapsulant with recess in multiple layers. This dimensional change allows increased integration density by utilizing vertical space rather than only horizontal expansion.
2Productivity
If feature size is continuously reduced, then integration density improves, but manufacturing precision requirements increase
Solution Approach 1:
The package structure is segmented into distinct functional layers (die, adhesive layer, encapsulant with recess) that can be manufactured and assembled separately. This segmentation allows each component to be optimized independently, reducing the cumulative precision requirements compared to monolithic small-featured structures.
3Reliability
If adhesion is enhanced through increased contact area, then reliability improves, but manufacturing complexity increases
Solution Approach 1:
The encapsulant features a localized recess structure that concentrates adhesion enhancement in the specific region where the die and adhesive layer are positioned, rather than requiring complex structures throughout the entire encapsulant. This local quality approach improves reliability at the critical interface while minimizing overall manufacturing complexity.
Data Source
AI summary
A package structure includes a redistribution layer (RDL) structure, a die, and an encapsulant. The die is attached to the RDL structure through an adhesive layer. The encapsulant is disposed on the RDL structure and laterally encapsulates the die and the adhesive layer. The encapsulant includes a protruding part extending into the RDL structure and having a bottom surface in contact with the RDL structure.


