Storage Controller Read Pattern Reuse for Optimal Read Voltage
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Solution Overview
Problem
Existing storage devices face performance degradation due to failed read operations caused by changes in transistor threshold voltages, leading to an increase in the number of read operations required to determine an optimal read voltage.
Innovation Solution
A storage device with a controller that determines at least two first and second optimal read voltages by performing specific read operations and storing read patterns, reducing the need for additional read operations through buffer memory usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If additional read operations are performed to determine an optimal read voltage when a read operation fails, then the reliability of read operations is improved, but the productivity of the storage device degrades due to increased number of read operations
Solution Approach 1:
The controller performs preliminary actions by determining and storing optimal read voltages and read patterns in advance during successful read operations. When a read operation fails, these pre-determined values are retrieved and reused, eliminating the need for time-consuming additional read operations to determine optimal voltages, thus maintaining both reliability and productivity
Solution Approach 2:
The system implements feedback mechanisms where the controller monitors read operation outcomes and uses this information to refine and store optimal read voltages and read patterns. This feedback loop allows the system to learn from failed read operations and adjust future read parameters, improving reliability without requiring repeated trial read operations
2Measurement precision
If the controller determines optimal read voltages through multiple read operations, then the measurement precision of read voltage optimization is improved, but the loss of time increases due to additional read operations
Solution Approach 1:
The controller performs preliminary determination of optimal read voltages and stores them in advance during initial successful read operations. When subsequent read operations are needed, the pre-determined optimal voltages are retrieved from storage, eliminating the time-consuming process of re-determining optimal voltages through multiple trial read operations, thus reducing time loss while maintaining precision
Solution Approach 2:
The system creates copies of optimal read voltage parameters and read patterns from successful read operations and stores them in the controller's memory. When a read operation fails, these copied parameters are reused instead of performing new determination operations, significantly reducing the time required for voltage determination while maintaining the precision achieved during the initial measurement phase
Data Source
AI summary
A read pattern obtained in a read operation for determining an optimal read voltage when an initial read operation fails is stored, and is used in a read operation to be subsequently performed for determining a new optimal read voltage.