Semiconductor Receiver Pulse Adjustment for Noise-Robust Signal Detection
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Solution Overview
Problem
Semiconductor devices using Manchester-coded differential signaling struggle to accurately receive signals due to noise interference, leading to unreliable data transmission.
Innovation Solution
Incorporating a receiver with an edge detection circuit, a pulse generating circuit, and a pulse adjusting circuit to detect and adjust the pulse width of one-shot pulses, ensuring accurate signal reception by minimizing noise-induced pulse collisions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If Manchester-coded differential signaling is used for communication, then data transmission can be achieved, but noise interference causes unreliable signal reception
Solution Approach 1:
The patent adjusts the pulse width parameter of the received signal to optimize signal detection. By dynamically changing the pulse width parameter based on signal characteristics, the system improves its ability to distinguish valid signals from noise, thereby enhancing reception reliability in noisy environments
Solution Approach 2:
The patent employs a feedback mechanism where the received signal characteristics are analyzed and used to adjust subsequent signal processing parameters. This closed-loop approach allows the system to adapt to varying noise conditions and maintain reliable communication by continuously optimizing signal detection based on actual reception quality
2Object-affected harmful factors
If pulse width is increased to prevent pulse collisions, then noise suppression improves, but signal timing precision deteriorates
Solution Approach 1:
The patent implements dynamic pulse width adjustment rather than using a fixed width. The pulse width is adaptively modified based on the detected signal characteristics and noise conditions, allowing the system to maintain optimal balance between noise suppression and timing precision for each individual signal reception event
Solution Approach 2:
The patent applies different pulse width adjustments to different portions of the signal or different signal types based on their specific characteristics. This localized optimization allows each signal to be processed with the most appropriate pulse width setting, maintaining timing precision while preventing pulse collisions in noisy conditions
Data Source
AI summary
A failure analysis device is for analyzing a failure of the semiconductor device equipped with a logic circuit and a memory circuit. It has a storage device and a processor. The storage device stores fail bit data obtained by testing the memory circuit and failure diagnosis data obtained by failure diagnosis for test results of the logic circuit. The processor extracts a fail I/O value from the fail bit data, extracts the data of the memory connection port which is the connection port to the memory circuit from among the estimated failure parts included in the failure diagnosis data, and determines match/not-match between the fail I/O value and the port ID value included in the data of the memory connection port.


