Recessed Conductive Layer for Precise Solder Bump Formation
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Solution Overview
Problem
The existing semiconductor packaging technologies face challenges in forming precise solder bumps on wide pads, leading to inconsistent configuration and height, which can result in bonding issues and short circuits during the reflow process.
Innovation Solution
Forming recesses on the conductive layer to confine the solder material and maintain its position and configuration, using electroplating and etching processes to create ring-shaped or other shaped recesses that surround the intended solder bump area, ensuring precise control over the solder bump's width, height, and shape.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional packaging technologies are used to form solder bumps on wide pads, then the manufacturing process is simple, but the solder bump configuration and height are inconsistent leading to bonding issues
Solution Approach 1:
The patent applies preliminary action by forming recesses in the conductive layer before depositing the solder bump material. These pre-formed recesses serve as molds that guide the solder material during the electroplating process, ensuring consistent bump configuration and height before the actual soldering occurs. This preliminary structuring prevents the inconsistency problems that arise with conventional direct-deposition methods on wide pads.
Solution Approach 2:
The recesses act as an intermediary structure between the wide conductive pad and the final solder bump. Rather than directly forming bumps on the flat pad surface, the recesses provide an intermediate mold that transfers the desired bump geometry onto the solder material during electroplating, ensuring precise configuration control while maintaining manufacturing simplicity.
2Manufacturing precision
If recesses are formed to confine solder material, then the solder bump precision is improved, but the manufacturing process complexity increases
Solution Approach 1:
The patent merges multiple functions into the recess structure: it serves as a mold for bump formation, a confinement barrier for solder material, and a positioning guide. By combining these functions into a single structural feature formed through standard semiconductor processing, the solution achieves high precision without proportionally increasing process complexity.
Solution Approach 2:
The patent changes the physical parameters of the conductive layer by creating recesses with specific depth and width parameters. These parameter changes in the substrate structure enable precise control of the solder bump dimensions during electroplating, achieving high precision through controlled geometric parameters rather than complex process control.
3Manufacturing precision
If electroplating and etching processes are used to create recesses, then the solder bump configuration precision is improved, but the manufacturing time and process steps increase
Solution Approach 1:
The patent segments the bump formation process into distinct stages: first forming the recess structure through etching, then filling with solder material through electroplating. This segmentation allows each process to be optimized independently and performed using standard semiconductor manufacturing equipment, reducing overall cycle time compared to attempting single-step precision bump formation.
Solution Approach 2:
The patent replaces mechanical stamping or compression methods with electroplating for solder material deposition. The electrochemical deposition process naturally fills the recesses with precise control over material placement, achieving high positioning accuracy without the mechanical complexity and time requirements of alternative methods.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The recesses effectively confine the solder material, ensuring precise formation of solder bumps with desired dimensions and positions, reducing the risk of bonding failures and short circuits, and improving the yield of semiconductor die bonding to other packages or substrates.
Implementation Method 1
using electroplating and etching processes to create ring-shaped or other shaped recesses that surround the intended solder bump area
Data Source
AI summary
Embodiments of mechanisms for forming a semiconductor die are provided. The semiconductor die includes a semiconductor substrate and a protection layer formed over the semiconductor substrate. The semiconductor die also includes a conductive layer conformally formed over the protection layer, and a recess is formed in the conductive layer. The recess surrounds a region of the conductive layer. The semiconductor die further includes a solder bump formed over the region of the conductive layer surrounded by the recess.


