Recessed Gate Structure for Dense Memory Cell Channels

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Solution Overview

Problem

The challenge in increasing the cell density of integrated chips without diminishing the performance of memory cells is due to the limitations imposed by the length of the channel region, as reducing the channel length can lead to short channel effects that negatively impact memory cell performance.

Innovation Solution

The integration of a gate structure over a recess in the substrate, where the channel region extends both laterally and vertically, allowing for a reduced lateral distance between source/drain regions while maintaining the length of the channel region, thereby increasing cell density without compromising performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the channel length is reduced to increase cell density, then the cell density increases, but the memory cell performance deteriorates due to short channel effects

Engineering Contradiction:
Improvecell densityVSAvoidmemory cell performance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent introduces a vertical dimension by forming a recess in the substrate and extending the channel region vertically along the recess sidewalls. This transforms the channel from a purely lateral structure to a three-dimensional structure that utilizes vertical space, thereby increasing cell density without reducing the effective channel length that controls performance.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The channel region is nested within the recess structure, with the gate structure wrapping around the channel region. The channel extends laterally between source/drain regions and vertically along the recess, creating a nested configuration that maximizes space utilization while maintaining electrical control.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Quantity of substance

If the lateral distance between source/drain regions is reduced to increase cell density, then the cell density increases, but the channel length must be reduced which causes short channel effects

Engineering Contradiction:
Improvecell densityVSAvoidchannel length
Core Design Contradiction:
Quantity of substanceVSLength of stationary object

Solution Approach 1:

The channel region is extended into the vertical dimension by forming it along the sidewalls of a recess in the substrate. This allows the channel to gain length in the vertical direction while the lateral footprint remains compact, thereby increasing cell density without sacrificing channel length.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The recess structure creates a localized region where the channel can extend vertically with different geometric properties than the lateral regions. The channel width varies along its length, being narrower in the vertical portion along the recess sidewalls, which provides better electrostatic control and mitigates short channel effects.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS11735636B2Integrated chip with a gate structure over a recess
Publication Date: 2023.08.22 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US11735636B2 patent drawing
  • US11735636B2 patent drawing
  • US11735636B2 patent drawing

AI summary

The present disclosure relates to an integrated chip comprising a substrate having a first top surface disposed at a first height, a second top surface disposed at a second height that is less than the first height, and a connecting surface extending from the first top surface to the second top surface. A first source/drain region is disposed along the first top surface of the substrate. A second source/drain region is disposed along the second top surface of the substrate and is laterally separated from the first source/drain region by a channel region of the substrate. A gate structure is arranged between the first source/drain region and the second source/drain region. The gate structure extends from over the first top surface of the substrate to over the connecting surface of the substrate. The gate structure also extends below the first top surface of the substrate.