Semiconductor Package Substrate With Recessed Solder Ball Standoff

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Solution Overview

Problem

Conventional semiconductor device packaging methods face challenges in reducing height while maintaining reliability, as smaller solder joints are prone to mechanical and thermal failures due to increased susceptibility to cracks and fatigue.

Innovation Solution

The use of substrates with bond pads located on inner conductive layers instead of outermost layers, allowing solder balls to be recessed into the substrate, reducing overall package height and minimizing reliability issues associated with smaller solder joints.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of stationary object

If solder joint size is reduced to decrease package height, then package height is reduced, but solder joint reliability deteriorates due to increased susceptibility to mechanical vibrations, thermal shock, and fatigue failure

Engineering Contradiction:
Improvepackage heightVSAvoidsolder joint reliability
Core Design Contradiction:
Length of stationary objectVSReliability

Solution Approach 1:

The invention moves the bond pad from the outermost surface to an inner layer of the substrate, changing the spatial dimension of the connection point. This allows the solder joint to be recessed into the substrate rather than protruding outward, reducing package height without compromising solder joint size or reliability. The solder joint maintains its full strength while being positioned in a recessed location.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If bond pad is located on outermost layer to simplify manufacturing, then manufacturing process is simpler, but package height increases due to protruding solder joints

Engineering Contradiction:
Improvesubstrate manufacturing simplicityVSAvoidpackage height
Core Design Contradiction:
Ease of manufactureVSLength of stationary object

Solution Approach 1:

The bond pad is repositioned from the outermost layer to an inner layer, utilizing the vertical dimension of the multi-layer substrate structure. This dimensional change allows solder joints to be recessed, reducing package height while maintaining manufacturing feasibility through standard multi-layer PCB techniques.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The bond pad on the inner layer is nested within the substrate structure rather than being exposed on the outer surface. The opening in the outer layer acts as a recess that accommodates the solder joint, creating a nested configuration that reduces overall package height while maintaining connection integrity.

Inventive Principle:
Principle #7Nested doll (Nesting)

3Reliability

If additional vias are added to connect inner layer bond pads, then electrical connection is achieved, but device complexity increases

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoidsubstrate structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The opening in the outer layer serves multiple functions simultaneously: it provides the recess for the solder joint to reduce package height, and it also serves as the electrical connection pathway from the outer surface to the inner layer bond pad. This multi-functionality eliminates the need for separate via structures, reducing device complexity while maintaining reliable electrical connection.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20240074048A1Semiconductor packaging with reduced standoff height
Publication Date: 2024.02.29 MICRON TECHNOLOGY INC
  • US20240074048A1 patent drawing
  • US20240074048A1 patent drawing
  • US20240074048A1 patent drawing

AI summary

A semiconductor device assembly includes a semiconductor die, a substrate carrying the semiconductor die, and a printed circuit board (PCB) coupled to the substrate. The PCB includes a primary conductive layer including a first surface of the substrate and a first solder mask layer coupled to the first surface. The substrate also includes a secondary conductive layer including a second surface of the substrate and a second solder mask layer coupled to the second surface. The substrate further includes an inner conductive layer positioned between the primary layer and the secondary layer, where the inner layer includes a bond pad positioned at the end of an opening that extends from the first solder mask layer through the primary layer to the bond pad of the inner layer. By attaching a solder ball to the bond pad of the inner layer, standoff height is reduced.