Reconfigurable Detector System for Curved Surface Inspection
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Solution Overview
Problem
Current backscatter x-ray systems with flat detectors struggle to detect a desired amount of backscatter from objects with curved shapes, resulting in lower image contrast and detail due to the inability to conform to non-planar surfaces, limiting their effectiveness in inspecting complex objects.
Innovation Solution
A backscatter x-ray system with a detector that can change its shape to conform to the surface of the object being inspected, using a reconfigurable detector system with flexible segments and micro-electromechanical systems technology to enhance detection capabilities across varying angles and surfaces.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a flat detector is used, then the device complexity is reduced, but the detection precision deteriorates when inspecting curved objects
Solution Approach 1:
The detector is divided into multiple independently movable segments that can be positioned at different angles and distances from the object surface, allowing each segment to optimally detect backscatter from curved surfaces while maintaining manageable device complexity
Solution Approach 2:
The detector transitions from a static flat structure to a dynamic reconfigurable system where segments can move to different positions and orientations, enabling the detector to adapt its shape to match various object geometries and maximize detection precision
2Ease of manufacture
If a flat detector is used, then the ease of manufacture is improved, but the adaptability deteriorates for curved surfaces
Solution Approach 1:
The detector is divided into multiple independently movable segments that can be positioned at different angles and distances from the object surface, allowing each segment to optimally detect backscatter from curved surfaces while maintaining manageable device complexity
Solution Approach 2:
The detector employs movable segments that can flex and reposition themselves to conform to curved object surfaces, providing the adaptability needed for versatile inspection while remaining manufacturable through modular design
3Device complexity
If the detector cannot conform to curved surfaces, then the device complexity is reduced, but the image quality deteriorates
Solution Approach 1:
The detector is divided into multiple independently movable segments that can be positioned at different angles and distances from the object surface, allowing each segment to optimally detect backscatter from curved surfaces while maintaining manageable device complexity
Solution Approach 2:
The detector system can dynamically change geometric parameters such as segment positions, angles, and distances to optimize image quality for different object shapes and inspection requirements
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The reconfigurable detector system improves the detection of backscatter, increasing image contrast and detail, allowing for more accurate inspection of complex objects without the need for excessive radiation and reducing the overall system size.
Implementation Method 1
When the x-ray beam encounters the object, some or all of the x-rays in the x-ray beam are scattered by the object. In particular, the x-rays may be scattered off of the surface of the object and/or the subsurface of the object. The scattered x-rays are referred to as backscatter.
Implementation Method 2
The collimator filters these x-rays to form an x-ray beam using a portion of the x-rays that travel substantially parallel to a specified direction.
Data Source
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AI summary
A method and apparatus for inspecting an object using a backscatter inspection system. In one illustrative embodiment, an apparatus comprises a radiation source, a collimator, and a detector system. The radiation source is configured to emit radiation. The collimator is configured to form a beam using a portion of the radiation emitted by the radiation source. The beam is directed towards a surface of an object. The detector system is configured to detect backscatter formed in response to the beam encountering the object. A shape of the detector system is configured to be changed into a selected shape.