Dynamically Reconfigurable Probe Card for Circuit Testing
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Solution Overview
Problem
Current probing systems for circuit elements, particularly in the semiconductor and electronics industry, face limitations such as fixed probe cards that are costly, have limited circuit size and probe density, require frequent redesign for changing circuit layouts, and result in low throughput and high operational costs, especially when dealing with high-frequency circuit designs.
Innovation Solution
A system utilizing orthogonal actuators and independently programmable probes that eliminate the need for manual fixed probe cards, allowing for flexible and high-speed probing of circuits of arbitrary size and density, with optical clearance for laser trimming and automated probe tip exchange, enabling efficient testing and trimming of circuit elements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If fixed probe cards are used for probing circuit elements, then probing stability and reliability are improved, but adaptability to different circuit layouts deteriorates and device complexity increases
Solution Approach 1:
The patent implements a dynamically reconfigurable probe card system where probe elements can be selectively activated, deactivated, or repositioned based on the specific circuit layout being tested. This allows the same physical probe card to adapt to multiple different circuit designs without requiring physical redesign, thereby maintaining reliability across different applications while improving adaptability.
Solution Approach 2:
The probe card is designed with universal probe elements that can function across multiple circuit configurations. The system incorporates a controller that manages the universal probe elements to perform different probing functions on various circuit layouts, eliminating the need for dedicated probe cards for each circuit design and reducing overall device complexity.
2Measurement precision
If fixed probe cards with high probe density are used, then measurement precision is improved, but manufacturing cost and device complexity increase
Solution Approach 1:
The probe card is divided into multiple segments or zones, each with probe elements optimized for specific measurement tasks. This segmentation allows high probe density to be achieved only where needed for precise measurements, while other areas use simpler probe configurations, thereby maintaining measurement precision while reducing overall device complexity and manufacturing cost.
3Measurement precision
If custom probe cards are designed for each circuit layout, then measurement precision is improved, but productivity decreases due to frequent redesign and manufacturing
Solution Approach 1:
The system uses dynamically reconfigurable probe elements that can be programmed to match different circuit layouts through software control. This eliminates the need for physical redesign and remanufacturing of probe cards for each new circuit design, allowing rapid adaptation to new measurements while maintaining precision, thereby significantly improving productivity.
Solution Approach 2:
The probe card system allows changes in operational parameters such as probe activation patterns, positioning, and measurement sequences to be adjusted via software to match different circuit layouts. This parameter flexibility enables precise measurement of various circuit designs using the same physical hardware, eliminating frequent manufacturing cycles and improving productivity.
4Ease of manufacture
If manual probe card insertion and alignment is performed, then ease of manufacture is improved, but productivity and time consumption deteriorate
Solution Approach 1:
The probe card system incorporates self-alignment features and automated insertion mechanisms that allow the probe card to automatically position and align itself with the circuit board without requiring manual intervention. This self-service capability maintains ease of manufacture while dramatically improving setup throughput and productivity by eliminating time-consuming manual alignment operations.
5Measurement precision
If fixed probe cards are used for high-frequency circuit testing, then measurement precision is improved, but adaptability to changing circuit designs deteriorates
Solution Approach 1:
The probe card incorporates dynamically reconfigurable elements that can be electronically controlled to adapt to different high-frequency circuit designs. This allows the same probe card to maintain measurement precision across various frequency ranges and circuit configurations by adjusting probe activation and measurement parameters through software, thereby improving adaptability without sacrificing precision.
Data Source
AI summary
A system and method of probing work pieces is described. A first and second arm each having a pivot point and a guide end are pivotally coupled together at the respective pivot points. A probe tip holder is coupled to at least one of the first arm or the second arm. A guide means guides movement of the guide ends of the pivotally coupled arms, such that movement of the guide end of the first arm and the second arm move the probe tip holder in a plane parallel to the work piece surface.