Reconfigurable Probe Card for Interposer Testing
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Solution Overview
Problem
Conventional boundary scan testing is ineffective for interposers with open connections before they are bonded to other package components, as it cannot be used to test passive interposers with no active devices.
Innovation Solution
A probe card with a reconfigurable switch network, programmable storage, and a controller/processor that allows probe pins to be dynamically configured as input or output pins, enabling efficient testing of interposers by applying driving patterns and comparing output signals with expected patterns to detect defective connections without mechanical rearrangement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional boundary scan testing is used for interposers, then testing can be performed after bonding, but testing cannot be performed before bonding due to open connections
Solution Approach 1:
The patent implements preliminary testing capability by providing test modes that can detect opens, shorts, and bridges in interposer connections before the interposer is bonded to other package components. This allows quality verification to occur earlier in the manufacturing process, eliminating the waiting period until after bonding is complete.
2Adaptability or versatility
If a fixed probe card configuration is used, then the probe card structure is simple, but the probe card cannot accommodate different interposer designs
Solution Approach 1:
The patent implements dynamic reconfigurability in the probe card through switch networks that can dynamically change the electrical connections between probe pins and test equipment. This allows the same probe card to be reconfigured for different interposer designs, contact pad layouts, and test requirements without physical modifications, achieving versatility while maintaining a relatively simple base structure.
Solution Approach 2:
The probe card is designed with universal functionality through reconfigurable switch networks and programmable storage that enable it to accommodate multiple interposer designs and test scenarios. The same probe card can be used across different product families and interposer configurations by changing the electrical configuration rather than requiring different hardware for each design.
3Measurement precision
If multiple test setups are used for different interposer designs, then each design can be tested optimally, but the number of test setups increases
Solution Approach 1:
The patent consolidates multiple specialized test setups into a single universal probe card system that can be reconfigured for different interposer designs. The reconfigurable switch network and programmable storage enable the same hardware to adapt to various test requirements, maintaining measurement precision across different designs while eliminating the need for multiple separate test setups.
Data Source
AI summary
A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first pattern, and reconnect the plurality of probe pins in a second pattern different from the first pattern.