Reconfigurable Test Accessory for Dynamic Protocol Analysis
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Solution Overview
Problem
Current test and measurement probes lack the ability to be updated or reconfigured after purchase, limiting their functionality and adaptability to evolving technologies and specific user needs, and they often struggle with handling complex signal protocols and high-speed data acquisition.
Innovation Solution
A reprogrammable test and measurement accessory with a processor, such as a microcontroller, FPGA, or SoC, that can be updated with new instructions and functions, allowing users to select and install only the necessary features and protocols, enabling advanced signal analysis and characterization, and managing multiple signal lanes and protocols.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If traditional fixed-function probes are used, then device complexity is reduced and ease of manufacture is improved, but adaptability and versatility deteriorate as new protocols and standards emerge
Solution Approach 1:
The probe incorporates a reprogrammable processor that can dynamically change its configuration and functionality through firmware updates. The processor can be reconfigured via a reprogramming interface to adapt to new communication protocols, standards, and testing requirements, transforming the static probe into a dynamic, evolving measurement tool.
Solution Approach 2:
The probe design integrates multiple processing functions within a single reprogrammable processor unit. This universal processor can be programmed to perform various protocol analysis, signal conditioning, and measurement tasks, replacing the need for multiple specialized fixed-function probes and enabling one device to serve multiple purposes.
2Measurement precision
If specialized fixed-function probes are manufactured for each protocol, then measurement precision for specific protocols is improved, but inventory requirements and loss of substance increase
Solution Approach 1:
Instead of manufacturing separate physical probes for each protocol, the invention creates a universal probe platform with a reprogrammable processor that can be software-configured to precisely analyze multiple different protocols. This eliminates the need to maintain inventories of specialized probes while preserving protocol-specific measurement precision through targeted firmware programming.
Solution Approach 2:
The probe achieves protocol-specific precision by changing software parameters and processing configurations rather than physical hardware. The reprogrammable processor can be updated with protocol-specific algorithms and settings, allowing the same physical device to deliver precise measurements for USB 2.0, USB 3.0, PCIe, or other protocols as needed.
3Productivity
If probes include comprehensive built-in processing capabilities, then productivity and measurement capabilities are improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The probe employs a reprogrammable processor that provides comprehensive processing capabilities only when and as needed through software configuration. Rather than hardwiring all possible processing functions, the dynamic reprogramming approach enables the probe to activate specific processing capabilities based on the current testing requirements, maintaining productivity while managing complexity.
Solution Approach 2:
The invention extracts the protocol-specific processing logic from fixed hardware and places it in reprogrammable firmware. This separation allows the core probe hardware to remain relatively simple while the processing capabilities are delivered through software that can be updated and configured as needed, reducing manufacturing complexity while maintaining high productivity.
Data Source
AI summary
A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.