Rectangular Probe Composite Pin for Collision Resistance
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Solution Overview
Problem
Conventional rectangular probe cards face issues with combining good current conduction and mechanical strength, and experience collisions, friction, and poor fixation due to their single-material construction.
Innovation Solution
The design incorporates a metallic pin with an insulating film and a ring-shaped insulating latch, which enhances structural strength without affecting conductivity, providing better buffering against collisions and friction by covering the outer surfaces of the middle segment and arranging the insulating latch around the film.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a conventional rectangular probe is made of a single material, then the manufacturing process is simple, but it cannot achieve both good current conduction property and good mechanical strength property simultaneously
Solution Approach 1:
The probe structure employs composite materials with a metallic pin (for electrical conduction) coated with an insulating film (for mechanical protection and insulation). This composite construction allows the probe to simultaneously achieve good current conduction through the metallic core and good mechanical strength through the insulating coating layer, resolving the contradiction between manufacturing simplicity and dual-performance reliability.
Solution Approach 2:
Different parts of the probe are assigned different material properties: the metallic pin provides electrical conduction in the core region, while the insulating film provides mechanical strength and insulation on the outer surface. This local differentiation of material qualities allows each region to optimize its function, achieving both conduction and mechanical properties simultaneously.
2Device complexity
If a conventional rectangular probe is made of a single material, then the structure is simple, but collisions, great friction, or poor fixation easily occur between the probe and probe head
Solution Approach 1:
The probe uses a composite structure where the insulating film coating on the metallic pin reduces friction and collision damage during insertion into the probe head. The insulating material provides a smoother interface and better fixation characteristics, improving reliability without significantly increasing structural complexity.
Solution Approach 2:
The insulating film acts as a protective cushion layer between the metallic pin and the probe head, preventing direct metal-to-metal contact during insertion. This beforehand cushioning reduces collision impacts and friction, improving the reliability of the connection while maintaining a relatively simple overall structure.
Data Source
AI summary
A probe card device and a rectangular probe are provided. The rectangular probe includes a metallic pin, an insulating film, and an insulating latch. The metallic pin includes a connecting portion, a detecting portion, and a middle segment arranged between the connecting portion and the detecting portion. The insulating film covers entirely outer surfaces of the middle segment. The insulating latch is in a ring shape and is arranged around at least part of the insulating film. A bottom of the insulating latch is arranged adjacent to the detecting portion. A length of the insulating latch is less than or equal to that of the insulating film, and a thickness of the insulating latch is larger than that of the insulating film and is at least 10 μm.