Redistribution Layer Conductive Pattern Layout for Package Reliability

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Solution Overview

Problem

The reliability of redistribution circuit structures in integrated fan-out packages is a concern due to the potential for conductor material to flow into the main portion of the metallization layer, affecting the integrity of the package structure.

Innovation Solution

The use of conductive patterns with specific configurations, such as conductive patterns electrically isolated from the main portion by slits and protrusions, prevents conductor material from flowing into the metallization layer, ensuring the reliability of the package structure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conductor material is used in the metallization layer, then electrical connectivity is achieved, but conductor material may flow into the main portion of the metallization layer, compromising structural integrity

Engineering Contradiction:
Improvepackage structure reliabilityVSAvoidmetallization layer integrity
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The conductive pattern is segmented into distinct portions (first portion, second portion, and connecting portion) that are electrically isolated from the main portion of the metallization layer through slits. This segmentation prevents conductor material from flowing into the main portion while maintaining electrical connectivity through the isolated conductive pattern structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The connecting portion acts as an intermediary element that electrically connects the first and second portions of the conductive pattern while being physically isolated from the main portion by slits. This intermediary structure enables electrical connectivity without allowing conductor material to mix with the main metallization layer.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If conductive patterns are electrically isolated from the main portion by slits, then electrical isolation is achieved, but the complexity of the metallization layer structure increases

Engineering Contradiction:
Improveelectrical isolationVSAvoidmetallization layer structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The metallization layer is segmented into a main portion and isolated conductive patterns with connecting portions, separated by slits. This segmentation achieves electrical isolation while maintaining a systematic structure that can be manufactured using standard photolithography and etching processes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the metallization layer have different properties: the main portion provides overall structural support, while the isolated conductive patterns with connecting portions provide localized electrical connectivity. The slits create local discontinuities that enable electrical isolation where needed while maintaining continuity elsewhere.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS12500200B2Package structure with conductive patterns in a redistribution layer
Publication Date: 2025.12.16 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12500200B2 patent drawing
  • US12500200B2 patent drawing
  • US12500200B2 patent drawing

AI summary

A package structure includes an insulating encapsulation, a semiconductor die, and a redistribution circuit structure. The semiconductor die is encapsulated in the insulating encapsulation. The redistribution circuit structure includes conductive patterns, wherein the conductive patterns each comprise a first portion, at least one second portion, and at least one connecting portion. A first edge of the at least one connecting portion is connected to the first portion, and a second edge of the at least one connecting portion is connected to the at least one second portion, wherein the first edge is opposite to the second edge, and a length of the first edge is greater than a length of the second edge.