Redistribution Layer Adjustment Structures for RF and ESD Control

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Solution Overview

Problem

Existing electronic devices face challenges in combining packaged semiconductor chips with application-specific mounting substrates without introducing unwanted electronic artifacts, particularly in managing radio frequency properties and protecting against electrostatic discharge.

Innovation Solution

The integration of an electrically conductive redistribution layer with adjustment structures that adjust radio frequency properties and electrostatic discharge protection structures, allowing for efficient suppression of electronic artifacts and universal compatibility with various substrates.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a standard redistribution layer is used for electrical connection, then electrical coupling between chip pads and interconnects is achieved, but radio frequency artifacts and electrostatic discharge damage occur

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoidradio frequency artifacts and electrostatic discharge
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces an intermediary redistribution layer with specifically designed adjustment structures that mediate between the chip pads and interconnects. These adjustment structures act as a buffer to suppress radio frequency artifacts and provide electrostatic discharge protection, preventing harmful effects from reaching the semiconductor chip while maintaining electrical connectivity.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent converts potentially harmful radio frequency signals and electrostatic discharge events into beneficial protection mechanisms. The adjustment structures in the redistribution layer are designed to absorb, dissipate, or redirect these harmful energy forms, transforming them from threats into protective features that safeguard the semiconductor chip.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Adaptability or versatility

If external adjustments are made on the substrate to optimize radio frequency properties, then radio frequency behavior can be tuned, but device complexity and manufacturing steps increase

Engineering Contradiction:
Improveradio frequency behavior adjustmentVSAvoidsubstrate modification complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent performs the radio frequency adjustment action in advance during the redistribution layer formation process, before final assembly. The adjustment structures are pre-configured with specific geometries and materials that provide the desired radio frequency characteristics, eliminating the need for subsequent substrate modifications or external tuning procedures.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent merges the electrical connection function with the radio frequency adjustment function into a single integrated redistribution layer structure. The adjustment structures are formed as part of the same manufacturing process that creates the electrical connections, combining multiple functions into one component rather than requiring separate substrate modifications.

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If the redistribution layer is designed with additional adjustment structures, then radio frequency properties and electrostatic discharge protection are improved, but manufacturing complexity increases

Engineering Contradiction:
Improveradio frequency and electrostatic discharge performanceVSAvoidredistribution layer fabrication
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent achieves enhanced radio frequency and electrostatic discharge performance by modifying parameters of the redistribution layer such as material composition, layer thickness, and geometric patterns of adjustment structures. These parameter changes are implemented within the existing thin-film manufacturing process window, allowing for improved performance without requiring fundamentally new fabrication techniques or equipment.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS9230926B2Functionalised redistribution layer
Publication Date: 2016.01.05 INFINEON TECHNOLOGIES AG

AI summary

An electronic device which comprises at least one interconnect, a semiconductor chip comprising at least one electric chip pad, an encapsulant structure packaging at least a part of the semiconductor chip, and an electrically conductive redistribution layer arranged between and electrically coupled with the at least one interconnect and the at least one chip pad, wherein the redistribution layer comprises at least one adjustment structure configured for adjusting radio frequency properties of a transition between the semiconductor chip and its periphery.