Spatial Frequency Domain Imaging With Reduced-Bit Sinusoidal Modulation
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Solution Overview
Problem
The measurement speed of spatial frequency domain imaging is slow due to limitations in measurement hardware, particularly in optical modulation devices that modulate structured light with a large number of coded bits.
Innovation Solution
Modulate light emitted by a light source in a spatial frequency domain to form a first target sinusoidal light pattern with a specified spatial frequency, using fewer coded bits, and collect light intensity distribution data to determine optical property parameters of a sample.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a large number of coded bits are used to modulate structured light with high spatial frequency, then measurement precision is improved, but measurement speed deteriorates
Solution Approach 1:
The patent changes the parameter of coded bit length from traditional long sequences to shortened sequences (e.g., reducing from 32 bits to 8 bits or fewer). This parameter change allows the system to maintain adequate measurement precision while dramatically improving measurement speed, as fewer bits require fewer modulation cycles and less data processing time
Solution Approach 2:
The patent applies partial action by using only the essential minimum number of coded bits needed to achieve acceptable measurement precision, rather than using excessive long sequences. This partial approach (using fewer bits than traditional methods) is sufficient to capture the necessary optical property information while significantly reducing measurement time
2Adaptability or versatility
If traditional square wave pattern is used for spatial frequency measurement, then low frequency measurement is achieved, but high frequency measurement capability is lost
Solution Approach 1:
The patent changes the waveform parameter from square wave to sinusoidal pattern. This parameter change enables the system to accurately measure both low and high spatial frequencies, as the sinusoidal pattern provides smoother transitions and better frequency response characteristics compared to the abrupt transitions in square waves
Solution Approach 2:
The patent inverts the traditional approach by using sinusoidal patterns instead of square wave patterns for spatial frequency modulation. This inversion of the conventional waveform choice allows the system to achieve superior performance across the entire spatial frequency spectrum, particularly improving high frequency measurement capability while maintaining low frequency accuracy
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach improves measurement speed and efficiency by allowing both high and low frequency spatial frequency measurements, while reducing noise interference and enhancing accuracy.
Implementation Method 1
obtaining a first target sinusoidal light pattern with a specified spatial frequency by modulating first light emitted by a light source in a spatial frequency domain
Implementation Method 2
collecting light intensity distribution data of second light, the second light is formed after the first target sinusoidal light pattern is reflected by the sample to be detected
Data Source
AI summary
A method for optical property measurement based on spatial frequency domain imaging, includes: obtaining a first target sinusoidal light pattern with a specified spatial frequency by modulating first light emitted by a light source in a spatial frequency domain, the number of coded bits of the first target sinusoidal light pattern is smaller than a preset number of bits; irradiating the first target sinusoidal light pattern to a surface of a sample to be detected; collecting light intensity distribution data of second light, the second light is formed after the first target sinusoidal light pattern is reflected by the sample to be detected; determining one or more optical property parameters of the sample to be detected according to the light intensity distribution data of the second light.


