Redundancy Electrode Cross-Shaped Defect Signal for Display Panel Short Circuit Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional display panel testing methods are inefficient in quickly and accurately identifying short circuits between electrodes, leading to prolonged testing times and increased production costs.
Innovation Solution
Incorporating a redundancy electrode between the pixel electrode, scan electrode, and common voltage electrode, coupled to the data electrode, which generates a cross-shaped defect signal during testing to precisely locate defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional testing methods are used to detect short circuits between electrodes, then the testing process is simple, but the defect location cannot be quickly and accurately identified
Solution Approach 1:
The patent introduces a redundancy electrode as an intermediary element between the scan electrode and common voltage electrode. This redundancy electrode acts as a mediator that, when shorted by a particle, creates a detectable cross-shaped signal pattern. The intermediary element transforms an otherwise undetectable short circuit into a visually identifiable defect pattern, enabling rapid and accurate defect location without extending testing time.
2Ease of repair
If conventional pixel structure is used without redundancy electrode, then the device structure is simple, but short circuit defects cannot be quickly located
Solution Approach 1:
The patent segments the pixel structure by adding a separate redundancy electrode layer between the scan electrode and common voltage electrode. This segmentation allows the defect detection function to be separated from the display function. The redundancy electrode creates distinct electrical pathways that, when compromised, generate identifiable cross-shaped patterns, making defect location straightforward without significantly complicating the overall pixel structure.
Data Source
AI summary
A pixel unit including a pixel electrode, a scan electrode, a common voltage electrode, a data electrode and at least one redundancy electrode is provided. During the fabricating process of the pixel unit, if a particle is simultaneously located between any two of the pixel electrode, the scan electrode and the common voltage electrode, it would cause a short circuit between the two electrodes. The pixel unit can generate a cross-shaped defect signal at the location where a short circuit happens when the pixel unit undergoes an array test or a cell test. The user can thereby quickly locate the defect and repair it.