Redundant ADC Testing via Segmented Evaluation and Comparison
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Solution Overview
Problem
Existing redundant analog-to-digital conversion systems require time-consuming full evaluations of both converters to ensure safety and performance, lacking a method to efficiently test the redundancy and performance status of the system.
Innovation Solution
A redundant analog-to-digital conversion system incorporating an input multiplexer, multiple converters, a comparison circuit, and an output multiplexer, which allows for a full evaluation of a primary converter output and an abbreviated evaluation of a secondary converter output using a comparison circuit to produce a comparison output, thereby reducing testing time and improving efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If full evaluation is performed on both converters to ensure safety and performance, then measurement precision and reliability are improved, but loss of time and productivity deteriorate
Solution Approach 1:
The evaluation process is segmented into two distinct types: full evaluation for the primary converter and abbreviated evaluation for the secondary converter. This segmentation allows the system to maintain high measurement precision for the primary converter while significantly reducing the time required for evaluating the secondary converter, thus resolving the contradiction between accuracy and testing time.
Solution Approach 2:
The patent applies partial action by performing only abbreviated evaluation on the secondary converter rather than full evaluation. The comparison circuit performs limited checks (such as checking if the secondary converter output matches the primary converter output within acceptable tolerances) rather than complete characterization, which reduces testing time while maintaining sufficient reliability for safety-critical applications.
2Reliability
If full evaluation is performed on both converters, then reliability is improved, but device complexity and ease of operation worsen
Solution Approach 1:
The comparison circuit merges the evaluation of both converters by directly comparing their outputs. Instead of treating them as completely separate evaluation processes, the system combines them through comparison, which simplifies the overall testing architecture while maintaining reliability. The merged approach allows the secondary converter to be validated against the primary converter without requiring duplicate full evaluation infrastructure.
Solution Approach 2:
The comparison circuit acts as an intermediary between the primary and secondary converters. It mediates the evaluation process by taking outputs from both converters and performing simplified validation, thereby reducing the complexity of the overall testing system while ensuring that the redundant converter meets safety requirements without requiring full evaluation complexity.
3Measurement precision
If separate testing of each converter is performed, then measurement precision is improved, but productivity and loss of time deteriorate
Solution Approach 1:
The testing process is segmented into precision-critical measurements for the primary converter and efficiency-optimized measurements for the secondary converter. This segmentation enables the system to maintain high measurement precision where it matters most (primary converter characterization) while improving overall productivity through abbreviated testing of the secondary converter using comparison-based validation.
Solution Approach 2:
The patent applies partial action by performing complete precision measurements only on the primary converter while using abbreviated comparison-based measurements for the secondary converter. This approach maintains necessary measurement precision for the primary device while significantly improving productivity by reducing the measurement burden on the secondary redundant converter.
Data Source
AI summary
A redundant analog-to-digital conversion system can include at least one input multiplexer, first and second redundant analog-to-digital converters, a comparison circuit and an output multiplexer. The at least one input multiplexer can receive a plurality of analog input signals and output at lest one multiplexed analog input signal. The first and second redundant analog-to-digital converters can convert the at least one multiplexed analog input signal to respectively generate first and second digital output signals, the first digital output having a greater digital resolution than the second digital output. The comparison circuit can produce a comparison output signal as a function of a comparison of a plurality of most significant corresponding bit pairs of the first and second digital output signals. The output multiplexer can produce a multiplexed output including information from the comparison output signal and one of the digital output signals.