Redundant Integrated Circuit Switching for Semiconductor Reliability

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Solution Overview

Problem

Semiconductor devices face challenges in maintaining long-time operation and high reliability due to performance deterioration, particularly in applications like monitoring cameras and in-vehicle cameras, where redundancy in integrated circuits is crucial but difficult to achieve effectively.

Innovation Solution

A semiconductor device with an integrated circuit configuration that includes a primary element and a redundant element, controlled by a controller to switch between operation and non-operation states based on performance deterioration signals, ensuring continuous functionality even as the primary element degrades.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If multiple semiconductor devices with the same configuration are included to increase redundancy, then reliability is improved, but device complexity increases

Engineering Contradiction:
ImprovereliabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The semiconductor device is segmented into multiple functional blocks (first functional block, second functional block, third functional block) where each block can be independently controlled. This allows selective activation of redundant components based on performance degradation, achieving reliability improvement without requiring all redundant components to be active simultaneously, thus managing device complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The controller dynamically adjusts the operation state of functional blocks based on real-time performance monitoring. When performance degradation is detected in the first functional block, the controller activates the second functional block as backup. This dynamic switching mechanism ensures reliability while avoiding the complexity of permanently activating all redundant components.

Inventive Principle:
Principle #15Dynamics

2Duration of action of moving object

If current carrying to the active semiconductor circuit is stopped and switching is performed when threshold reversal occurs, then long-time operation is ensured, but productivity decreases

Engineering Contradiction:
Improveoperation timeVSAvoidproductivity
Core Design Contradiction:
Duration of action of moving objectVSProductivity

Solution Approach 1:

The system performs preliminary monitoring of performance characteristics and prepares backup functional blocks in advance. When performance degradation reaches a threshold, the controller has already identified suitable alternative blocks, enabling smooth switching without interruption. This preliminary preparation ensures long-time operation while minimizing productivity loss during transitions.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The controller continuously monitors performance characteristics of functional blocks and uses this feedback to determine when to switch between blocks. This feedback mechanism allows the system to optimize switching timing, ensuring long-time operation while maintaining productivity by switching only when necessary and using the most efficient functional block at each moment.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS11841467B2Semiconductor device, photoelectric conversion device, photoelectric conversion system, transport apparatus, and control method of semiconductor device
Publication Date: 2023.12.12 CANON KK
  • US11841467B2 patent drawing
  • US11841467B2 patent drawing
  • US11841467B2 patent drawing

AI summary

A semiconductor device comprising an integrated circuit is provided. The integrated circuit comprises a first element configured to execute a predetermined operation, a second element, and a controller configured to perform control of setting the second element in a non-operation state in a case in which performance deterioration of the first element is a first degree and operating the second element in a case in which the performance deterioration of the first element is a second degree larger than the first degree.