Redundant Segment Testing for Segmented Filters and Memory
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Solution Overview
Problem
In-service testing in safety-critical applications like automotive systems is challenging due to test patterns interfering with normal functional behavior and creating power spikes, and adding fully redundant hardware is impractical due to high cost and power usage.
Innovation Solution
Implementing devices as multiple smaller segments and using a similarly sized redundant segment for testing, allowing for continuous in-service testing without interrupting operation, by comparing outputs and rotating testing across segments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If fully redundant hardware is added for in-service testing, then reliability is improved, but cost and power usage increase significantly
Solution Approach 1:
The device is divided into multiple segments (first device segment, second device segment, third device segment) where each segment can be independently tested. This segmentation allows the redundant segment to be reused across multiple device segments over time, reducing the total amount of redundant hardware needed compared to a fully redundant approach.
Solution Approach 2:
The redundant device segment serves multiple functions: it can replace any of the device segments for testing purposes, and it can be rotated to test different segments sequentially. This multi-functionality reduces the need for dedicated redundant hardware for each segment, thereby reducing overall power consumption and cost.
2Reliability
If fully redundant hardware is added for in-service testing, then reliability is improved, but cost increases significantly
Solution Approach 1:
By segmenting the device into multiple independent segments and using a segmented redundant approach, the total amount of redundant hardware is reduced. Instead of having a complete duplicate of the entire device, the system uses a smaller redundant segment that can be rotated to test different portions of the device, lowering cost.
Solution Approach 2:
The patent implements partial redundancy rather than full redundancy. The redundant segment is sized to test one device segment at a time, and through rotation and time-multiplexing, it provides coverage for multiple segments. This partial approach achieves adequate reliability without the excessive cost of complete redundancy.
3Reliability
If test patterns are applied during in-service testing, then reliability is improved, but normal functional behavior is interfered with and power spikes occur
Solution Approach 1:
The testing function is extracted from the normal operational path by using a separate redundant device segment. Test patterns are applied to the redundant segment rather than the active device segment, allowing testing to occur without interfering with normal functional behavior and avoiding power spikes in the operational system.
Solution Approach 2:
The redundant device segment acts as an intermediary for testing. Instead of applying test patterns directly to the operational device segment (which would cause interference and power spikes), the test patterns are applied to the redundant segment, which mediates the testing process without affecting normal operation.
4Reliability
If test patterns are applied during in-service testing, then reliability is improved, but normal functional behavior is interfered with
Solution Approach 1:
The testing operation is extracted from the normal functional path by using a redundant device segment. The active device segment continues to perform its normal function while the redundant segment undergoes testing, allowing both testing and normal operation to proceed simultaneously without interference.
Solution Approach 2:
The redundant device segment serves as an intermediary that absorbs the testing operation. Normal functional behavior continues in the active segment while the redundant segment mediates the testing process, ensuring that test patterns do not interfere with operational functionality.
Data Source
AI summary
Disclosed are systems and methods for providing in-service testing using a redundant segment. A device (e.g., memory, filter, GPU) is implemented as multiple device segments. For example, a filter including 1024 taps may be implemented as sixteen smaller filter segments that include 64 taps each. A redundant segment that is of similar size to the device segments is used to provide in-service testing of the individual device segments. For example, the redundant segment is provided the same input as a device segment and the output of the redundant segment and the device segment are compared to determine whether the device segment is operating correctly. Multiplexers are used to cycle use of the redundant segment to provide in-service testing of each of the device segments. For example, the multiplexers can be configured into different modes to provide for testing of the various device segments.