Reference ADC Random Sampling for Time-Interleaved Calibration
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Solution Overview
Problem
Existing analog-to-digital converters (ADCs) face challenges in achieving accurate and reliable conversion performance due to errors and artifacts arising from fabrication limitations and environmental changes, which are not effectively addressed by conventional specialized circuitry, leading to trade-offs in speed and resolution.
Innovation Solution
Incorporating an on-chip microprocessor (uP) within ADCs to provide flexible digital processing and calibration capabilities, allowing for adaptable error correction and signal processing, including calibration functions that can be configured to meet various application requirements without silicon changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional specialized circuitry is used for error correction in ADCs, then manufacturing precision can be improved, but device complexity and cost increase
Solution Approach 1:
The patent replaces specialized analog error correction circuitry with a digital microprocessor-based system. The microprocessor executes calibration algorithms to correct errors in ADC sub-converters, substituting complex analog circuitry with a more flexible digital processing approach that reduces overall device complexity while maintaining correction accuracy
Solution Approach 2:
The microprocessor serves multiple functions including error detection, calibration execution, and performance optimization across different ADC operating conditions. This universal digital platform replaces multiple specialized circuit blocks, simplifying the overall ADC architecture while providing comprehensive error correction capabilities
2Productivity
If ADC speed is increased, then productivity is improved, but measurement precision deteriorates
Solution Approach 1:
The patent implements a feedback-based calibration system where the microprocessor continuously monitors ADC performance and adjusts calibration parameters to maintain accuracy at high speeds. The system measures conversion results and uses this feedback to optimize error correction, enabling high-speed operation without sacrificing precision
Solution Approach 2:
The system performs preliminary calibration before high-speed conversion operations begin. The microprocessor pre-computes correction factors and configures the ADC for optimal performance at the desired speed, allowing the converter to operate at high productivity while maintaining measurement precision through pre-established correction mechanisms
3Measurement precision
If resolution is increased, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent divides the high-resolution conversion task into multiple lower-resolution sub-converters operating in parallel. The microprocessor then combines and calibrates the outputs of these sub-converters to achieve the desired high resolution. This segmentation approach reduces the complexity of individual converter blocks while maintaining overall high measurement precision
Data Source
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AI summary
Analog-to-digital converters (ADCs) can have errors which can affect their performance. To improve the performance, many techniques have been used to compensate or correct for the errors. When the ADCs are being implemented with sub-micron technology, ADCs can be readily and easily equipped with an on-chip microprocessor for performing a variety of digital functions. The on-chip microprocessor and any suitable digital circuitry can implement functions for reducing those errors, enabling certain undesirable artifacts to be reduced, and providing a flexible platform for a highly configurable ADC. The on-chip microprocessor is particularly useful for a randomized time-interleaved ADC. Moreover, a randomly sampling ADC can be added in parallel to a main ADC for calibration purposes. Furthermore, the overall system can include an efficient implementation for correcting errors in an ADC.