Peeling Force Estimation Across Angles From Reference Tests
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Solution Overview
Problem
Existing peeling force measurement methods are inefficient and inaccurate when measuring at various peeling angles other than 90°, requiring significant effort and compromising measurement accuracy.
Innovation Solution
A peeling force estimation method and apparatus that calculates peeling force at different angles using a predetermined calculation formula, such as Eq. (1), based on actual measured values at a reference angle, allowing for estimation at angles between 0° and 180°.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If peeling force is measured at various peeling angles through actual testing, then measurement accuracy is improved, but measurement time and effort increase significantly
Solution Approach 1:
The patent performs preliminary action by conducting actual peeling force measurements at reference peeling angles (such as 90°) in advance to establish baseline data. These preliminary measurements are used to create calculation formulas that can then estimate peeling forces at other angles without requiring additional physical testing, thus saving time while maintaining accuracy
Solution Approach 2:
The patent creates a mathematical model (calculation formula) that copies the relationship between peeling angle and peeling force based on actual measurement data. This mathematical copy allows estimation of peeling forces at various angles without repeating physical experiments, effectively transferring the accuracy of actual measurements to theoretical calculations
2Adaptability or versatility
If peeling force is measured at various peeling angles through actual testing, then comprehensive data coverage is improved, but operational complexity increases
Solution Approach 1:
The patent creates a universal calculation formula that can estimate peeling forces at any peeling angle within a certain range (e.g., 0° to 180°) based on measurements at reference angles. This multi-functional approach allows a single set of reference measurements to provide data coverage for multiple different angles, eliminating the need for separate measurements at each angle
Solution Approach 2:
The patent changes the approach from physically adjusting measurement parameters (peeling angles) to mathematically calculating results based on parameter relationships. By establishing a mathematical relationship between peeling angle and peeling force, the system can determine forces at various angles through calculation rather than physical reconfiguration
3Device complexity
If only 90° peeling angle measurement is performed, then device complexity is reduced, but measurement versatility deteriorates
Solution Approach 1:
The patent introduces a mathematical calculation formula as an intermediary between the simple 90° measurement apparatus and the need for various angle data. This intermediary translates the limited 90° measurement into estimates for other angles, allowing a simple device to provide versatile measurement capabilities through mathematical mediation
Data Source
AI summary
The peeling force estimation method, for estimating peeling force in peeling a test film from an adherend surface by pulling one end of the test film that has separated from the adherend surface, where the test film is in a state of being attached to the adherend surface along a surface length direction of the adherend surface, includes: actually measuring the peeling force at a predetermined peeling angle (hereinafter, referred to as an actual measurement angle) using a peeling test apparatus to acquire an actual measured value of the peeling force, the peeling angle being defined as an angle formed between the test film and the adherend surface; and calculating the peeling force at a peeling angle other than the actual measurement angle using the actual measured value and a predetermined calculation formula representing a relationship between the peeling angle and the peeling force.