Dynamic Reference-Arm Interferometry for Laser Depth Control

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Solution Overview

Problem

Current laser technologies face challenges in achieving precise axial control during material processing, particularly in surgical and industrial applications, due to limitations in controlling the depth of laser beam penetration, leading to issues such as unintended tissue damage and weld quality problems.

Innovation Solution

An apparatus and method utilizing an optical interferometer to generate an interferometry output based on optical path lengths, which is used to control processing parameters of a material modification process, enabling real-time feedback and precise control of the material processing beam's depth and motion.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If standard metrology techniques are used to guide laser processing, then quality assurance is obtained, but plasma generation and electrical interference interfere with measurement

Engineering Contradiction:
Improvequality assuranceVSAvoidplasma generation and electrical interference
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent uses an optical interferometer as an intermediary measurement system that operates in the optical domain rather than electrical domain. The interferometer measures depth through optical path length differences using light reflections from the material surface and subsurface, avoiding direct electrical contact with the plasma environment. The measurement beam is separated from the processing laser beam using wavelength discrimination

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system replaces traditional electrical/electronic metrology instruments with an optical-based interferometric measurement system. This substitution eliminates susceptibility to electrical interference and plasma generation, as the measurement is performed using light rather than electrical signals that would be disrupted by the laser-induced plasma

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Productivity

If the processing laser power is increased to improve processing speed, then productivity is improved, but axial control precision deteriorates

Engineering Contradiction:
Improveprocessing speedVSAvoidaxial control precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The system dynamically adjusts laser processing parameters in real-time based on feedback from the interferometer. As the laser penetrates the material and processing conditions change (temperature, density, optical properties), the control system continuously modifies power, pulse duration, and focal position to maintain optimal axial control precision throughout the entire processing sequence, enabling high power processing without sacrificing precision

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution provides precise control over the material processing depth, improving the accuracy and reliability of laser-based surgeries and industrial processes by enabling real-time adjustment of processing parameters, thus enhancing safety and productivity.

Implementation Method 1

an optical interferometer that produces an interferometry output using at least a component of the imaging light that is delivered to the sample, the interferometry output based on at least one optical path length to the sample compared to another optical path length

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS11534858B2Methods and systems for coherent imaging and feedback control for modification of materials using dynamic optical path switch in the reference arms
Publication Date: 2022.12.27 IPG PHOTONICS CORP
  • US11534858B2 patent drawing
  • US11534858B2 patent drawing
  • US11534858B2 patent drawing

AI summary

Methods and systems are provided for using optical interferometry in the context of material modification processes such as surgical laser or welding applications. An imaging optical source that produces imaging light. A feedback controller controls at least one processing parameter of the material modification process based on an interferometry output generated using the imaging light. A method of processing interferograms is provided based on homodyne filtering. A method of generating a record of a material modification process using an interferometry output is provided.