Reference Diode Junction Temperature Control
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Solution Overview
Problem
The challenge in accurately determining and controlling the junction temperature of semiconductor devices, especially heat-generating devices with high power density, leads to inaccuracies in device characterization and potential overheating, affecting their performance and circuit design.
Innovation Solution
A method involving a reference diode adjacent to the device under test is used to derive the junction temperature by obtaining current-temperature characteristics, applying a reverse bias, and adjusting the environment temperature to maintain the junction temperature within a predetermined range, utilizing a controller to stabilize the temperature.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a reference diode is used to determine junction temperature, then measurement precision is improved, but device complexity increases
Solution Approach 1:
A reference diode is introduced as an intermediary element to indirectly measure the junction temperature of the device under test. The reference diode, being in thermal contact with the device, provides a temperature indicator through its reverse saturation current characteristics, avoiding the need for direct temperature measurement at the junction.
Solution Approach 2:
The patent replaces direct physical temperature measurement mechanisms with an electrical measurement approach. By measuring the reverse saturation current of the reference diode and using it to infer temperature through established current-temperature relationships, the system substitutes complex thermal measurement hardware with simpler electrical measurement circuitry.
2Manufacturing precision
If environment temperature is adjusted to control junction temperature, then temperature control precision is improved, but loss of time increases
Solution Approach 1:
The system implements a feedback control mechanism where the junction temperature is continuously monitored through the reference diode's reverse saturation current, and the environment temperature is automatically adjusted based on the deviation from the target temperature. This closed-loop control improves temperature control accuracy while reducing stabilization time by actively correcting temperature deviations rather than relying on passive thermal equilibrium.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the precision of junction temperature determination and control, reducing inaccuracies and overheating risks, thereby improving device characterization and performance.
Implementation Method 1
obtaining a reverse saturation current of the reference diode
Data Source
AI summary
The present disclosure provides a method for controlling a junction temperature of a device under test, including applying a reverse bias to a reference diode adjacent to the device under test, obtaining a calibration current of the reference diode under the reverse bias, deriving the junction temperature of the device under test according to the reference diode, and adjusting an environment temperature when the junction temperature of the device under test is deviated from a predetermined value by a predetermined temperature range.


