Reference Position Detection Using Dual Pattern ROI Matching
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods for determining reference positions on flat pieces, such as plastic cards, face challenges in achieving high accuracy and robustness due to sensitivity to image deviations and the need for manual corrections, especially when using subpixel pattern matching with single point measurements.
Innovation Solution
A method that involves detecting a first reference pattern and using its position data to define a region of interest, where a second reference pattern is detected with higher accuracy, allowing for improved determination of the reference position by leveraging known spatial relations between the patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If subpixel pattern matching with a single point measurement is used, then the measurement process is simple, but the measurement precision deteriorates due to sensitivity to image deviations and lack of robustness
Solution Approach 1:
The patent divides the measurement task into two parts: first detecting a reference pattern to obtain initial position data, then using this data to define a region of interest for detecting a second reference pattern. This segmentation allows each detection to be optimized for its specific purpose, improving overall measurement precision while maintaining manageable process complexity
Solution Approach 2:
The patent transitions from single-point measurement to multi-point measurement by detecting both a first reference pattern and a second reference pattern within a defined region of interest. This dimensional expansion from one point to multiple points provides redundancy and allows for more accurate determination of the reference position through correlation analysis
2Productivity
If a single point measurement is performed, then the measurement process is fast, but the reliability deteriorates due to high sensitivity to image deviations
Solution Approach 1:
The patent performs a preliminary detection of the first reference pattern to obtain initial position data before defining the region of interest for the second detection. This preliminary action guides the subsequent focused measurement, maintaining speed while improving reliability through the robustness of multi-point correlation
Solution Approach 2:
The position data from the first reference pattern detection serves as feedback to define the region of interest for the second detection. This feedback mechanism ensures that the second detection is focused on the relevant area, improving measurement reliability while maintaining efficiency through targeted analysis
Data Source
AI summary
A method for determining a reference position, on one side of a flat piece, wherein: image data is acquired; a first reference pattern is detected based on the image data, and first position data is determined for the first reference pattern; based on the first position data, a region of interest is defined in the image data; in the region of interest, a second reference pattern (34) is detected and second position data is determined for the second reference pattern; based on the first position data and the second position data, the reference position is determined. In addition, the present disclosure relates to a system for determining a reference position including an image data acquisition unit and an evaluation unit.