Reference Voltage Generator for Fuse Read Circuits
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Solution Overview
Problem
Existing digital memory devices with one-time programmable (OTP) memory elements require significant space for generating reference voltages for each fuse, and the combination of comparators, latches, and fuses often operates at lower voltages than the operating voltages of the latches and fuses, leading to inefficiencies in reading and determining the state of OTP memory elements.
Innovation Solution
A reference voltage generator circuit that mirrors a reference current to produce a reference voltage and a gate bias voltage, allowing each fuse read circuit to compare the fuse voltage to the reference voltage and indicate the state of each fuse, while operating within the mid-operating range of the comparator to ensure accuracy, even at low supply voltages.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a reference voltage is generated for each fuse using dedicated circuitry, then the fuse can be accurately read, but the space required on the board increases significantly
Solution Approach 1:
The patent merges the reference voltage generation functionality into a shared resource that serves multiple fuse read circuits. Instead of each fuse having its own dedicated reference voltage circuitry, a single reference voltage generator provides reference voltages to multiple fuse read circuits through multiplexing, thereby reducing the overall circuit area while maintaining measurement accuracy.
Solution Approach 2:
The reference voltage generator is designed with multi-functionality to serve multiple purposes. It can generate reference voltages for different fuses sequentially or in parallel using multiplexed readout circuits, allowing a single circuit to perform what would traditionally require multiple separate circuits, thus reducing board space requirements.
2Use of energy by moving object
If comparators and latches operate at lower voltages than the supply voltage, then power consumption is reduced, but the operating voltage range is limited
Solution Approach 1:
The patent employs dynamic voltage scaling where the reference voltage generator can adapt its output voltage to match the operating conditions. The system dynamically adjusts the reference voltage based on the supply voltage level, allowing the comparators and latches to operate efficiently across different voltage ranges while maintaining accuracy. This dynamic adaptation enables the system to operate at lower voltages for reduced power consumption while still being versatile enough to handle various supply conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution reduces the space required for generating reference voltages and allows for accurate reading of OTP memory elements at lower supply voltages, improving the efficiency and accuracy of determining the programmed or unprogrammed state of fuses in digital memory devices.
Implementation Method 1
The reference voltage generator circuit can be configured to mirror a reference current to produce a reference voltage and a gate bias voltage
Implementation Method 2
Each fuse read circuit of the plurality of fuse read circuits can be configured to mirror the reference current using the gate bias voltage to produce a fuse read voltage across each fuse coupled to the plurality of fuse read circuits
Implementation Method 3
Each fuse read circuit of the plurality of fuse read circuits can compare the fuse read voltage of each fuse and the reference voltage and can indicate a state of each fuse coupled to each fuse read circuit using the comparison
Data Source
AI summary
This document discusses, among other things, a reference voltage generator circuit coupled to a plurality of fuse read circuits. The reference voltage generator circuit can be configured to mirror a reference current to produce a reference voltage and a gate bias voltage. The plurality of fuse read circuits can each be coupled to the reference voltage generator circuit and can also be coupled to a fuse of a plurality of fuses. Each fuse read circuit of the plurality of fuse read circuits can be configured to mirror the reference current using the gate bias voltage to produce a fuse read voltage across each fuse coupled to the plurality of fuse read circuits. Each fuse read circuit of the plurality of fuse read circuits can compare the fuse read voltage of each fuse and the reference voltage and can indicate a state of each fuse coupled to each fuse read circuit using the comparison.