Reference Voltage Circuit Test System Using Comparator Delay Adjustment
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Solution Overview
Problem
The existing reference voltage circuit requires lengthy testing times due to low leakage current conditions, leading to increased manufacturing time and costs, as each switching element must be tested for suitability, and the accuracy of current flowing from capacitors is critical for correct operation.
Innovation Solution
A system and method that utilize a control logic unit to adjust the comparator's delayed voltage, allowing for a reduced test voltage comparison, and includes a first and second capacitor connected to switches, where the control logic unit records timing differences during charging and discharging to determine if the switching elements meet the test criteria, significantly reducing the required test time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the comparator uses the original allowable value as comparison reference, then the test accuracy is maintained, but the test time becomes excessively long
Solution Approach 1:
The patent applies preliminary action by pre-calculating and storing the relationship between different comparison references and their corresponding leakage current thresholds in a lookup table before actual testing. During testing, the system quickly queries this pre-prepared table to determine the appropriate comparison reference based on the selected test voltage, avoiding time-consuming real-time calculations and enabling fast accurate testing.
Solution Approach 2:
The patent replaces the traditional mechanical comparison method (direct voltage comparison with fixed allowable values) with an electronic substitution approach using a lookup table and microcontroller. The system substitutes the complex real-time mathematical calculations with pre-computed lookup tables and simple memory queries, significantly reducing test time while maintaining accuracy through electronic data processing.
2Reliability
If multiple comparison references are tested to ensure accuracy, then the reliability is improved, but the device complexity increases
Solution Approach 1:
The patent applies universality by designing a single test system that can handle multiple comparison references and test voltages through a unified lookup table structure. The microcontroller and lookup table work together as a multi-functional unit that adapts to different testing requirements without needing separate dedicated circuits for each comparison reference, simplifying the overall device architecture.
Solution Approach 2:
The patent uses parameter changes by allowing the comparison reference voltage to be dynamically adjusted based on the selected test voltage through the lookup table. Instead of using fixed comparison references, the system changes the comparison reference parameter according to the specific testing conditions, enabling flexible and accurate testing across different voltage levels without increasing hardware complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for quick confirmation of suitable switching elements in a short test time, reducing time and cost, while maintaining the accuracy of the reference voltage circuit, and can adjust testing references according to user needs.
Implementation Method 1
storing the bandgap reference voltage output by the highly accurate bandgap reference voltage circuit in the capacitor
Implementation Method 2
The comparator is connected to the first capacitor and the second capacitor respectively to compare the voltage difference between the first capacitor and the second capacitor
Data Source
AI summary
Provided is a system for testing a reference voltage circuit applicable to a reference voltage circuit. The reference voltage circuit includes a bandgap reference voltage circuit, switching elements, a first capacitor, a second capacitor and a comparator. The testing system includes a control logic unit. In a test mode, the control logic unit adjusts an allowable value of the comparator to speed up the suitability test of the switching elements.