Reflectance Detection Using Dual-Wavelength Laser Interpolation
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Solution Overview
Problem
Existing laser processing technologies require a laser oscillator emitting the same wavelength as the detection-target wavelength to measure reflectance, which is uneconomical and impractical for parties without the necessary equipment, especially when determining appropriate processing conditions for workpieces.
Innovation Solution
A reflectance detection method and apparatus that calculates reflectance by irradiating a workpiece with laser beams of shorter and longer wavelengths than the detection-target wavelength, using expressions to determine the reflectance at the detection-target wavelength without requiring a laser oscillator of the same wavelength, and employing a coupler to coalesce these beams for pseudo generation of the detection-target wavelength.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a laser oscillator of the same wavelength as the detection-target wavelength is used to measure reflectance, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent uses laser beams of different wavelengths (first wavelength X1 shorter than detection-target wavelength X, and second wavelength X2 longer than X) to copy or simulate the reflectance measurement effect at the detection-target wavelength. By measuring reflectance at two known wavelengths and using linear interpolation, the system calculates the reflectance at the target wavelength without needing a laser oscillator that actually emits at that wavelength. This replaces the need for an expensive, wavelength-specific laser oscillator with more readily available lasers at adjacent wavelengths.
Solution Approach 2:
The patent introduces an intermediary calculation method using linear interpolation between two measured wavelengths (X1 and X2) to determine the reflectance at the target wavelength (X). The formula H=H1+(H2−H1)×(X−X1)/(X2−X1) acts as an intermediary that bridges the gap between the measurable wavelengths and the desired target wavelength, eliminating the need for direct measurement at the target wavelength.
2Measurement precision
If a laser oscillator of the same wavelength as the detection-target wavelength is prepared, then reflectance detection accuracy is improved, but ease of operation deteriorates
Solution Approach 1:
Instead of requiring operators to prepare and handle a specific wavelength laser oscillator that matches the detection-target wavelength, the system copies the measurement capability by using readily available lasers at wavelengths X1 and X2. This eliminates the operational burden of sourcing and managing specialized laser equipment while maintaining measurement accuracy through the interpolation calculation.
3Adaptability or versatility
If laser beams of different wavelengths are used to calculate reflectance, then adaptability is improved, but measurement precision may deteriorate
Solution Approach 1:
The patent changes the wavelength parameter of the laser beams used for measurement, employing beams at wavelengths X1 and X2 (both different from the detection-target wavelength X) to calculate the reflectance at wavelength X. This parameter substitution approach allows the system to adapt to different workpiece types and laser processing conditions by selecting appropriate reference wavelengths while maintaining measurement accuracy through the linear interpolation formula that accounts for the wavelength-dependent reflectance behavior.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the calculation of reflectance at the detection-target wavelength without possessing a laser oscillator of that wavelength, facilitating economical and practical reflectance detection for various workpieces.
Implementation Method 1
a workpiece is irradiated with a laser beam and reflectance is detected
Implementation Method 2
employing a coupler to coalesce these beams for pseudo generation of the detection-target wavelength
Data Source
AI summary
A reflectance detection method in which a workpiece is irradiated with a laser beam and reflectance is detected, irradiating, with a light amount H0, the workpiece with a laser beam with a first wavelength X1 shorter than a detection-target wavelength X and detecting a light amount H1 of reflected return light, irradiating the workpiece with a laser beam with a second wavelength X2 longer than the detection-target wavelength X with the light amount H0 and detecting a light amount H2 of reflected return light, and employing H calculated based on an expression shown below as the light amount of return light obtained when the workpiece is irradiated with the detection-target wavelength X and calculating reflectance obtained when the workpiece is irradiated with the detection-target wavelength X based on H/H0.H=H1+(H2−H1)×(X−X1)/(X2−X1)