Method for determining relative degrees of reflectance of a measurement surface
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Solution Overview
Problem
Existing methods for determining relative reflectance values of measurement surfaces are limited by low spatial resolution and require precise calibration, making them time-consuming and prone to inaccuracies, especially in applications like solar-thermal tower power plants and architectural measurements.
Innovation Solution
A method that involves moving a measurement spot along two non-parallel paths to record spatially resolved images, using evaluation lines to determine relative reflectance values at points of intersection, allowing for higher spatial resolution and reduced calibration requirements, and enabling the use of inhomogeneous intensity distributions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single measurement spot path is used to determine reflectance values, then the measurement process is simple, but the spatial resolution is low and the measurement is time-consuming
Solution Approach 1:
The patent applies dimensionality change by transitioning from a single linear measurement path to a two-dimensional grid network of measurement paths. Multiple measurement spots traverse along first paths in a first direction and along second paths in a second direction, creating an overlapping measurement coverage that significantly enhances spatial resolution while maintaining reasonable measurement time through systematic path planning
2Measurement precision
If multiple non-parallel measurement paths are used to improve spatial resolution, then the measurement accuracy increases, but the device complexity and calibration requirements increase
Solution Approach 1:
The patent applies segmentation by dividing the measurement area into a grid structure with multiple discrete measurement paths oriented in different directions. The measurement spot systematically traverses along these segmented paths, with evaluation lines intersecting at grid points. This segmentation approach enables high spatial resolution through multiple measurement angles while maintaining manageable system complexity through regular path patterns
Solution Approach 2:
The patent applies parameter changes by varying the orientation and position of measurement paths across the measurement surface. Instead of using a single fixed path, the system employs multiple paths with different orientations (first direction and second direction), changing the measurement parameters to achieve comprehensive coverage and improved spatial resolution without requiring complex adaptive mechanisms
3Measurement precision
If precise calibration is required for accurate reflectance determination, then the measurement accuracy is high, but the ease of operation decreases and calibration time increases
Solution Approach 1:
The patent applies self-service by enabling the measurement system to automatically perform reflectance determination through systematic multi-directional path traversal. The evaluation unit automatically processes images captured at multiple intersection points along the grid network of measurement paths, calculating relative reflectance values without requiring manual calibration intervention. This self-service approach maintains high measurement precision while significantly improving ease of operation
Solution Approach 2:
The patent applies preliminary action by pre-defining the network of measurement paths and evaluation lines before actual measurement begins. The systematic grid structure with predetermined first and second paths is established in advance, allowing the measurement spot to automatically traverse and collect data at all necessary intersection points. This preliminary configuration enables accurate reflectance determination without requiring complex calibration procedures during operation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method achieves faster and more accurate determination of relative reflectance values with higher spatial resolution, reducing the need for precise calibration and allowing for the use of various intensity profiles, thus improving measurement efficiency and applicability across different surfaces.
Implementation Method 1
measurement radiation is applied to the measurement surface such that a measurement spot arises on the measurement surface
Data Source
AI summary
A method for determining relative degrees of reflectance of a measurement surface, having the method steps of applying measurement radiation to the measurement surface, such that a measurement spot is produced on the management surface, moving the measurement spot along at least a first straight measurement spot path, over the measurement surface in accordance with a first path movement and along a second straight measurement spot path with a second path movement, recording a first and second image sets of a plurality of locally resolved images of the measurement surface during the first path movement and the second path movement. An evaluation is carried out at intersection points, whose location points on the management surface are defined by evaluation lines, wherein a first group of straight evaluation lines within the first measurement path region and a second group of straight evaluation lines within the second measurement path region are predefined and/or determined. The evaluation lines of the first group are parallel to the first measurement spot path and the evaluation lines of the second group are parallel to the second measurement spot path, and each first group evaluation line has an intersection point with each second group evaluation line. For each intersection point, a maximum greyscale value is determined, and relative degrees of reflectance of the measurements surface are determined at least on a subset of the intersection points, depending on these greyscale values.