Reflection-Guided Illumination Switching for Accurate DPM Scanning
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Solution Overview
Problem
Conventional scanning devices face challenges in accurately illuminating and decoding direct part marking (DPM) indicia due to reflections and lack of contrast, leading to inefficient illumination configurations and resource wastage.
Innovation Solution
A scanning device that automatically switches illumination modes based on detected reflection shapes to optimize illumination settings, using components like an illumination unit, imager, and processing device to analyze and adjust illumination characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional illumination methods are used to scan DPM indicia, then the scanning device can capture images, but reflections and lack of contrast reduce scanning accuracy and decoding performance
Solution Approach 1:
The system dynamically switches between multiple illumination modes (on-axis, off-axis, polarized, unpolarized) based on real-time analysis of reflection shapes detected in captured images. This dynamic adaptation allows the system to optimize illumination characteristics for different object surfaces and viewing angles, thereby reducing harmful reflections and improving scanning accuracy.
Solution Approach 2:
The system changes illumination parameters including angle of incidence, polarization state, and illumination geometry by selecting from multiple predefined illumination modes. These parameter changes are made in response to detected reflection patterns, allowing the system to transform harmful reflections into beneficial illumination configurations that enhance contrast and decoding performance.
2Measurement precision
If multiple illumination modes are available to optimize scanning, then scanning accuracy improves, but device complexity increases
Solution Approach 1:
The system performs self-diagnosis by automatically detecting reflection shapes in captured images and autonomously selecting the appropriate illumination mode without external intervention. The processing device analyzes the reflection patterns and self-adjusts the illumination configuration, eliminating the need for manual setup and reducing operational complexity despite having multiple illumination modes available.
Solution Approach 2:
The system implements a feedback loop where the imager captures images, the processing device analyzes reflection shapes, and the illumination mode is adjusted accordingly. This closed-loop feedback mechanism automatically optimizes illumination based on actual scanning conditions, managing device complexity through intelligent control rather than requiring complex mechanical adjustment mechanisms.
3Productivity
If automatic illumination switching is implemented, then resource usage efficiency improves, but processing complexity increases
Solution Approach 1:
The system pre-defines multiple illumination modes with specific characteristics (on-axis, off-axis, polarized, unpolarized) that can be quickly switched between. This preliminary preparation of illumination configurations allows the system to rapidly adapt to different scanning scenarios without requiring complex real-time calculations or gradual adjustments, thereby improving resource usage efficiency while managing processing complexity through pre-computed solutions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Improves scanning accuracy and efficiency by selecting optimal illumination modes, reducing computing resource usage and enhancing decoding performance.
Implementation Method 1
detect a reflection shape in at least a first image related to an object
Data Source
AI summary
Various embodiments herein relate to automatically switching illumination for a scanning device based on detected reflections. In this regard, a reflection shape is detected in at least a first image related to an object associated with a direct part marking (DPM) indicia. Based on the reflection shape, one or more characteristics associated with the object are determined. Based on the one or more characteristics associated with the object, an illumination mode is selected from a plurality of illumination modes. Additionally, an illumination is projected via an illumination unit based on the illumination mode to capture a second image related to the object associated with the DPM indicia.