Reflection Measurement System with Apertured RAM

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Solution Overview

Problem

Current imaging systems, such as millimeter wave imaging systems, face challenges in accurately measuring reflection data for substances like narcotics and explosives due to non-idealities in measurement systems, which affect the precision of reflection coefficient measurements.

Innovation Solution

A free space reflection measurement system utilizing a transceiver antenna and Radar Absorbing Material (RAM) with an aperture, positioned between the antenna and the measurement region, to reduce lateral movement sensitivity and environmental reflections, improving measurement accuracy by using a test sample with calibration standards to correct for errors and precisely locate the measurement reference plane.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a conventional measurement system is used without RAM, then the system is simpler, but measurement precision deteriorates due to environmental reflections and lateral movement sensitivity

Engineering Contradiction:
Improvereflection coefficient measurement accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Radar Absorbing Material (RAM) is introduced as an intermediary component between the transceiver antenna and the measurement region. The RAM absorbs electromagnetic radiation that would otherwise reflect from the environment or sample holder, eliminating spurious reflections that degrade measurement precision. The RAM with aperture serves as a mediator that allows desired radiation through while blocking harmful reflected radiation.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If RAM with aperture is introduced to reduce environmental reflections, then measurement precision improves, but device complexity increases

Engineering Contradiction:
Improvereflection data accuracyVSAvoidmeasurement system structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The RAM is configured with a specific aperture structure that provides different properties in different regions: the aperture region allows electromagnetic radiation to pass through to illuminate the sample, while the surrounding RAM material absorbs radiation to eliminate reflections. This local differentiation of properties enables the system to achieve high measurement precision without requiring complete redesign of the entire measurement apparatus.

Inventive Principle:
Principle #3Local quality

3Measurement precision

If calibration standards are used without test sample combination, then calibration is simpler, but measurement precision deteriorates due to inaccurate reference plane location

Engineering Contradiction:
Improvereference plane location accuracyVSAvoidcalibration procedure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The calibration standards are combined with the test sample in a stacked configuration during calibration measurements. This merging allows the reference plane to be accurately located at the sample surface by using the known reflection properties of the calibration standards in conjunction with the test sample. The combination enables simultaneous calibration and sample measurement, improving reference plane location accuracy.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system provides highly accurate reflection data across a wide range of frequencies, enhancing the ability to discriminate between substances and reducing systematic errors, thereby improving the dynamic range and precision of reflection coefficient measurements.

Implementation Method 1

The present measurement system and methods also use a Radar Absorbing Material (RAM) with a RAM aperture, which can reduce lateral movement sensitivity of a sample, reduce reflections from the surrounding environment

Methodology Applied
Scientific EffectRadar Absorbing Material (RAM): Absorption (EM radiation)

Implementation Method 2

illuminating the test sample with electromagnetic radiation over a predetermined frequency range, wherein the electromagnetic energy is transmitted from the transceiver antenna through the aperture in the RAM

Methodology Applied
Scientific EffectElectromagnetic radiation transmission: Electromagnetic Induction

Implementation Method 3

reflected electromagnetic radiation from the test sample returns to the transceiver antenna via the aperture

Methodology Applied
Scientific EffectElectromagnetic radiation reflection: Reflection

Data Source

PatentUS11269071B2Measurement system and methods of measuring a reflection coefficient
Publication Date: 2022.03.08 THE GOVERNMENT OF THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SEC OF HOMELAND SECURITY
  • US11269071B2 patent drawing
  • US11269071B2 patent drawing
  • US11269071B2 patent drawing

AI summary

The present disclosure is directed to a measurement system for measuring a reflection coefficient of a test sample, including: a transceiver antenna configured to be coupled to a source of electromagnetic radiation; and a RAM positioned between the transceiver antenna and a measurement region of the transceiver antenna, wherein the RAM comprises an aperture substantially orthogonal to and substantially aligned with a transceiving axis of the transceiver antenna. A method for obtaining error correction of a measurement system and a method of measuring a reflection coefficient in a test sample are also provided.