Reflection Characteristic Measuring Device Error Correction
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Solution Overview
Problem
Integrated reflection characteristic measuring devices often experience measurement errors due to recursive diffused illumination, particularly when multiple geometries are combined, leading to inaccurate readings of spectral reflectance and gloss values.
Innovation Solution
A reflection characteristic measuring device that includes a diffuse reflecting surface, such as an integrating sphere, and employs multiple optical systems with different geometries to measure various reflection characteristics, while using a corrector to account for errors caused by light reflected from the diffuse surface, thereby reducing measurement errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple geometries are integrated into one measuring device, then the device can measure multiple types of reflection characteristics, but measurement errors occur due to recursive diffused illumination
Solution Approach 1:
The patent divides the optical measurement system into separate geometries (first geometry with diffuse reflecting member for spectral reflectance, second geometry without diffuse reflecting member for gloss value) that operate independently. Each geometry is segmented to perform its specific measurement function without interfering with others, thereby eliminating measurement errors while maintaining multi-measurement capability.
Solution Approach 2:
The patent extracts the diffuse reflecting member from the second geometry, leaving it without a diffuse reflecting member while the first geometry retains it. This extraction eliminates the source of recursive diffused illumination that caused measurement errors in gloss value measurement, while the first geometry continues to provide diffuse illumination for spectral reflectance measurement.
2Measurement precision
If a diffuse reflecting member is included in the measuring device, then diffuse illumination can be generated for spectral reflectance measurement, but light is diffusely reflected and causes measurement errors in other geometries
Solution Approach 1:
The patent applies local quality by providing the diffuse reflecting member only in the first geometry where it is needed for spectral reflectance measurement, while the second geometry for gloss value measurement is designed without it. This localized placement ensures diffuse illumination is generated only where required, preventing harmful recursive diffused illumination in other measurement geometries.
Solution Approach 2:
The patent converts the potential harmful effect of the diffuse reflecting member into a beneficial feature by strategically positioning it only in the first geometry. The diffuse reflecting member that could potentially cause measurement errors is instead used exclusively to generate the diffuse illumination required for accurate spectral reflectance measurement, while its absence in the second geometry prevents gloss measurement errors.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The device effectively corrects for errors caused by recursive diffused illumination, providing more accurate measurements of reflection characteristics like spectral reflectance and gloss values by accounting for light reflections and emissions from the diffuse surface.
Implementation Method 1
a diffuse reflecting member having a diffuse reflecting surface that performs diffuse reflection
Implementation Method 2
an error generated by light emitted from an object of measurement being reflected by the diffuse reflecting surface and illuminating the object of measurement
Data Source
Figure 1A~1B
Figure 2~3
Figure 4~5
AI summary
The reflection characteristic measuring device (M, Ma-Mf) according to the present invention is a device that includes a diffuse reflecting surface and measures a plurality of mutually different types of reflection characteristics (Sh) by using a plurality of optical systems having mutually different geometries, which corrects the reflection characteristics (Sh) to be measured by an error (E) generated when light emitted from an object of measurement is reflected from the diffuse reflecting surface and illuminates the object of measurement. The reflection characteristic measuring device (M, Ma-Mf) according to the present invention is therefore capable of reducing errors resulting from recursive diffused illumination.