Reflection Characteristic Measuring Apparatus for Sheet Specimens

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Solution Overview

Problem

Existing reflection characteristic measuring apparatuses for sheet specimens are inefficient in scanning color samples arranged in a two-dimensional array, requiring long scanning times and necessitating complex correction processes due to variations in the distance between the illuminating and light-receiving systems and the specimen surface.

Innovation Solution

A reflection characteristic measuring apparatus with a scanning part that moves the illuminating and light-receiving systems relative to each other, allowing for parallel scanning of one-dimensional arrays to measure color samples in a two-dimensional array at high speed, and a calibration method using a calibration reference plate with discrete reference areas to reduce measurement variations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a manual scan type reflection characteristic measuring apparatus is used to measure color samples arranged in a two-dimensional array, then measurement can be performed, but the scanning process becomes complicated and time-consuming

Engineering Contradiction:
Improvescanning speedVSAvoidscanning process complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The apparatus divides the two-dimensional array of color samples into multiple one-dimensional arrays. Multiple illuminating and light-receiving systems are arranged to scan these one-dimensional arrays in parallel, converting a complex two-dimensional scanning task into simpler parallel one-dimensional scanning tasks, thereby improving scanning speed while reducing operational complexity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple illuminating and light-receiving systems are combined to operate simultaneously on different one-dimensional arrays of color samples. This parallel operation merges multiple measurement functions into a single apparatus, achieving high-speed scanning of two-dimensional arrays without increasing operational complexity

Inventive Principle:
Principle #5Merging (Combining)

2Measurement precision

If the distance between the illuminating and light-receiving system and the specimen surface varies during scanning, then measurement can be performed, but correction processes are necessary to eliminate measurement errors

Engineering Contradiction:
Improvereflection characteristic measurement accuracyVSAvoidcorrection process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A calibration reference plate with discrete reference areas is introduced as an intermediary standard for calibration. By measuring the reflection characteristics of these known reference areas, the apparatus can determine calibration factors that compensate for distance variations, eliminating measurement errors without requiring complex real-time correction processes during scanning

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

Calibration is performed in advance using a calibration reference plate before actual measurement of color samples. This preliminary calibration establishes correction factors that account for distance variations, allowing accurate measurements to be obtained during subsequent scanning operations without requiring complex real-time adjustments

Inventive Principle:
Principle #10Preliminary action

3Productivity

If multiple illuminating and light-receiving systems are used for parallel scanning, then scanning speed increases, but calibration variations between different systems may occur

Engineering Contradiction:
Improvescanning speedVSAvoidcalibration consistency
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

A single calibration reference plate serves as a universal calibration standard for all illuminating and light-receiving systems. By using this common reference, each system can be calibrated against the same known standards, ensuring consistent calibration factors across all systems and eliminating calibration variations while maintaining parallel scanning capability

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables rapid measurement of reflection characteristics in a two-dimensional array and reduces calibration variations by calibrating multiple illuminating and light-receiving systems using a calibration reference plate, allowing for materials prone to reflection characteristic changes over time to be used.

Implementation Method 1

a group of illuminating and light-receiving systems for directing illuminating light onto a specimen surface of the sheet specimen held by the specimen holding part and for receiving reflected light from the specimen surface

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS8130371B2Method of calibrating reflection characteristic measuring apparatus for sheet specimen
Publication Date: 2012.03.06 KONICA MINOLTA SENSING INC
  • US8130371B2 patent drawing
  • US8130371B2 patent drawing
  • US8130371B2 patent drawing

AI summary

A reflection characteristic measuring apparatus capable of scanning a specimen surface of a sheet specimen at a high speed is provided. The reflection characteristic measuring apparatus includes a group of illuminating and light-receiving systems for directing illuminating light onto the specimen surface of the sheet specimen held by a specimen holding roller pair and for receiving reflected light from the specimen surface. The illuminating and light-receiving systems measure a spectral characteristic of the received reflected light. The illuminating and light-receiving systems are disposed over one-dimensional arrays of color samples which extend in the longitudinal direction of the sheet specimen, and scan the one-dimensional arrays in a direction opposite to a direction in which the sheet specimen is transported.