Reflection Phase Microscope Scanning Mirror Waveplate Design
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Solution Overview
Problem
Reflection phase microscopes using digital holographic techniques face limitations in achieving high spatial resolution and wide-area imaging due to diffraction noise and limited numerical apertures, which affect image quality and acquisition speed.
Innovation Solution
A reflection phase microscope design that includes a polarization beam splitter, scanning mirror, diffraction grating, and wave plates to adjust the angle of incidence and polarization of light beams, allowing for full numerical apertures of objective lenses and off-axis technique to reduce diffraction noise and enhance imaging capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional reflection phase microscope design is used, then the structure is simple, but diffraction noise increases and spatial resolution decreases
Solution Approach 1:
The patent employs a scanning mirror to dynamically adjust the angle of incidence of light beams onto the polarization beam splitter. This dynamic adjustment enables the system to optimize the interference pattern formation and reduce diffraction noise adaptively, thereby improving spatial resolution without requiring a completely static or fixed optical configuration.
Solution Approach 2:
The patent utilizes wave plates to modify the polarization state of light beams, changing the optical parameters of the system. By adjusting polarization angles and states through the wave plates, the system optimizes beam interference conditions, reduces diffraction effects, and enhances spatial resolution through controlled parameter modification.
2Productivity
If the numerical aperture of objective lenses is limited, then the device complexity is reduced, but imaging area and acquisition speed are restricted
Solution Approach 1:
The scanning mirror dynamically varies the angle of incidence across a range, enabling the system to scan and capture a wider field of view without requiring physically larger optical components. This dynamic angular adjustment increases the effective imaging area and acquisition speed while maintaining manageable device complexity.
Solution Approach 2:
The patent introduces angular dimension control through the scanning mirror, adding a dimensional degree of freedom to the optical path. By controlling light beams at different angles, the system expands the effective imaging area and enhances acquisition speed without proportionally increasing the physical size or complexity of the optical train.
3Measurement precision
If the angle of incidence is not adjusted, then the device complexity is minimized, but wide-area imaging and high spatial resolution cannot be achieved
Solution Approach 1:
The scanning mirror provides dynamic angle adjustment capability, allowing the system to achieve high spatial resolution and wide-area imaging by varying the angle of incidence. This single dynamic component enables multiple imaging conditions without requiring complex multi-component optical systems, balancing performance requirements with manageable device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design enables high spatial resolution and improved image quality by covering wide areas with adjustable incidence angles, reducing diffraction noise and increasing image acquisition speed.
Implementation Method 1
a polarization beam splitter splitting the light irradiated from the light source unit into a sample beam and a reference beam
Implementation Method 2
a diffraction grating diffracting the sample beam reflected by the sample unit and the reference beam reflected by the reference mirror
Implementation Method 3
a first wave plate vertically polarizing the sample beam reflected by the sample unit and incident on the polarization beam splitter
Implementation Method 4
a second wave plate vertically polarizing the reference beam reflected by the reference mirror and incident on the polarization beam splitter
Data Source
AI summary
A reflection phase microscope is disclosed. The reflection phase microscope includes: a light source unit irradiating light; a polarization beam splitter splitting the light irradiated from the light source unit into a sample beam and a reference beam; a sample unit reflecting the sample beam toward the polarization beam splitter; a reference mirror reflecting the reference beam toward the polarization beam splitter; a scanning mirror adjusting the angle of incidence of the light from the light source unit on the polarization beam splitter such that the angle of incidence of the sample beam on the sample unit and the angle of incidence of the reference beam on the reference mirror are adjusted; a diffraction grating diffracting the sample beam reflected by the sample unit and the reference beam reflected by the reference mirror; and an image acquisition unit receiving the beams diffracted by the diffraction grating.