Reflection Profile Measurement for Surface State Detection
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Solution Overview
Problem
Current image processing systems in factory automation are limited in performance due to the reliance on a single brightness condition for image measurement, which fails to accurately capture the surface state of objects, such as scratches, leading to suboptimal inspection precision.
Innovation Solution
An image processing system that employs a control device with an illumination device capable of independently controlling partial regions of a light emission surface, generating reflection profile information by capturing images under varying light conditions, and performing image measurements based on this information to improve surface state detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If images are captured under one brightness condition, then the image processing device can perform measurement efficiently, but the surface state of the object does not appear accurately on the image
Solution Approach 1:
The light emission surface is divided into multiple independent partial regions that can be controlled separately. The control device selectively illuminates different partial regions to capture images under varying brightness conditions, enabling accurate surface state detection without requiring complex multi-device illumination systems
Solution Approach 2:
The illumination device dynamically changes brightness conditions by controlling different partial regions of the light emission surface. This dynamic illumination adjustment allows the system to capture multiple images under different brightness conditions, improving surface state detection accuracy while maintaining a simple device structure
2Productivity
If images are captured under one brightness condition, then the system structure remains simple, but the image measurement performance is limited
Solution Approach 1:
The control device sequentially illuminates different partial regions of the light emission surface and captures images periodically under varying brightness conditions. This periodic illumination pattern enables the system to collect multiple images with different surface state information efficiently, improving measurement performance without excessive time loss
Solution Approach 2:
The illumination device maintains continuous operation by sequentially activating different partial regions without turning off the entire system. This continuous useful action ensures that multiple images are captured under different brightness conditions with minimal interruption, enhancing image measurement performance while reducing time loss
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances image measurement performance by capturing detailed reflection characteristics of objects, allowing for more accurate detection of surface features like scratches and improving overall inspection precision without the need for specific illumination conditions.
Implementation Method 1
an illumination device (4) capable of independently controlling partial regions of a light emission surface
Implementation Method 2
Measurement of an object based on a reflection profile
Data Source
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AI summary
An image processing system, an image processing device and an image processing method are provided. A control device (100) controls a light emission portion (4) in a manner that each of plural types of partial regions (43) set on a light emission surface (40) emits light, and controls a camera (8) to image an object (W) in synchronization with light emission of each of the plural types of partial regions (43). The control device (100) performs an image measurement of the object (W) based on reflection profile information (70) which is generated based on a plurality of input images (D), and shows a relationship between positions within the light emission surface (40) and degrees of light (Lc) reflected to attention sites (A) of the object (W) and incident to the imaging portion (8) with respect to light (Li) irradiated from the positions to the object (W).