Reflection-Reducing Layer System via Plasma Nanostructuring

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Solution Overview

Problem

Conventional anti-reflection coatings for optical elements lack sufficient reduction of reflection across a wide range of angles and exhibit poor climatic stability, particularly in moist heat conditions, due to the limitations of materials with higher refractive indices.

Innovation Solution

A method involving the application of an organic layer with a nanostructure created via plasma etching, followed by a cover layer and post-treatment to reduce the effective refractive index, resulting in a reflection-reducing layer system with enhanced broadband antireflection properties and improved climate stability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conventional dielectric layer system with materials like MgF2 is used for anti-reflective coating, then the coating can be applied to optical elements, but the residual reflection cannot be sufficiently reduced and climatic stability is poor

Engineering Contradiction:
Improveclimatic stabilityVSAvoidresidual reflection
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent applies a plasma etching process to the organic layer to create a nanostructured porous surface with controlled pore sizes and distributions. This porous structure reduces the effective refractive index of the layer, enabling broader bandwidth and angle-independent anti-reflective properties while improving climatic stability through the crosslinked organic material composition.

Inventive Principle:
Principle #31Porous materials

Solution Approach 2:

The patent uses a composite structure consisting of an organic layer (such as polyamide, polyimide, or acrylic resin) combined with inorganic crosslinking agents or fillers. This composite approach allows tuning of the refractive index and enhancement of climatic stability while maintaining the anti-reflective functionality across wide angle ranges.

Inventive Principle:
Principle #40Composite materials

2Object-generated harmful factors

If a nanostructure is created on the substrate surface using plasma etching to reduce reflection, then broadband and angle-independent anti-reflection is achieved, but the process complexity increases

Engineering Contradiction:
Improvereflection reductionVSAvoidprocess complexity
Core Design Contradiction:
Object-generated harmful factorsVSDevice complexity

Solution Approach 1:

The patent applies a thin organic layer to the substrate surface before performing plasma etching. This preliminary application of the organic layer provides a controlled material that can be etched into the desired nanostructure, simplifying the overall process compared to direct substrate etching and enabling better control over the nanostructure morphology.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent controls the plasma etching parameters (power, pressure, gas composition, etching time) to directly generate the desired nanostructure morphology from the organic layer. By optimizing these parameters, the process achieves consistent nanostructure formation with reduced reflection properties without requiring additional complex processing steps.

Inventive Principle:
Principle #35Parameter changes

3Length of stationary object

If the organic layer is made thinner to maintain nanostructure visibility, then the anti-reflective effect is preserved, but the layer becomes more sensitive to climatic conditions

Engineering Contradiction:
Improvelayer thicknessVSAvoidclimatic stability
Core Design Contradiction:
Length of stationary objectVSReliability

Solution Approach 1:

The patent creates a nanostructured surface where the organic material is distributed in a controlled manner with specific pore sizes and wall thicknesses. This local structural organization ensures that even thin layers maintain sufficient mechanical integrity and climatic stability while preserving the anti-reflective optical properties through the engineered nanostructure geometry.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent employs plasma treatment or chemical crosslinking processes that act as strong oxidizing conditions to crosslink the organic polymer chains. This crosslinking strengthens the organic layer, improving its resistance to moisture and heat while maintaining the thin layer structure and nanostructure morphology for optimal anti-reflective performance.

Inventive Principle:
Principle #38Strong oxidants (Accelerated oxidation)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method achieves a further reduced residual reflection and increased climatic stability by creating a nanostructured organic layer with a cover layer, leading to a low effective refractive index and maintaining optical properties under varying climatic conditions.

Implementation Method 1

a nanostructure is subsequently created in the layer of organic material using a plasma etching process

Methodology Applied
Scientific EffectPlasma etching: Plasma

Implementation Method 2

The organic layer is preferably applied by a vacuum coating process such as thermal evaporation or plasma-enhanced deposition

Methodology Applied
Scientific EffectThermal evaporation: Evaporation

Implementation Method 3

The organic layer is preferably applied by a vacuum coating process such as thermal evaporation or plasma-enhanced deposition

Methodology Applied
Scientific EffectPlasma-enhanced deposition: Plasma Enhanced Chemical Vapour Deposition

Implementation Method 4

the organic layer material is at least partially removed or decomposed. This post-treatment can, in particular, cause the organic layer material to be partially converted into NH3 or other gaseous components

Methodology Applied
Scientific EffectThermal decomposition: Pyrolysis

Data Source

PatentEP3559710B1Method for producing a reflection-reducing layer system
Publication Date: 2023.07.19 FRAUNHOFER GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG EV
  • EP3559710B1 patent drawingFigure 1A~1B
  • EP3559710B1 patent drawingFigure 1C~1D
  • EP3559710B1 patent drawingFigure 2~3

AI summary

The invention relates to a method for producing a reflection-reducing layer system on a substrate (1), comprising the following steps: depositing an organic layer (2); generating a nanostructure (4) in the organic layer (2) using a plasma etching process; applying a cover layer (3) onto the nanostructure (4), wherein the organic layer (2) provided with the nanostructure (4) and the cover layer (3) together form a reflection-reducing structure (6), wherein the cover layer (3) has an inorganic material or a silicon-organic compound, and wherein the cover layer (3) is at least 5 nm thick; and carrying out a post-treatment after the application of the cover layer (3), wherein the material of the organic layer (2) is at least partially removed, broken down or chemically converted, and wherein the effective refractive index neff,2 of the reflection-reducing structure (6) is smaller after the post-treatment than the effective refractive index neff,1 of the reflection-reducing structure (6) before the post-treatment.