Reflective Energy Filter Beam-Adjusting Lens for LVSEM Contrast

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Solution Overview

Problem

Existing energy filters in low-voltage scanning electron microscopes (LVSEM) face challenges in achieving fine energy-discrimination power and high uniformity of energy-discrimination powers over a large field of view due to their energy-angle-depending and position-depending filtering, which limits image contrast and throughput.

Innovation Solution

An energy filter of reflection type is designed with a beam-adjusting lens to make the charged particle beam incident onto a potential barrier as a substantially parallel beam, allowing for fine energy-discrimination power at the center and high uniformity over the entire field of view, and separate detectors are used to detect secondary electrons and backscattered electrons within different energy ranges for enhanced image contrast.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If an energy filter is used to filter charged particles by energy, then energy-discrimination power is improved, but uniformity of energy-discrimination power over field of view deteriorates due to position-depending filtering

Engineering Contradiction:
Improveenergy-discrimination powerVSAvoiduniformity of energy-discrimination power
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

A beam-adjusting lens is introduced as an intermediary component between the charged particle source and the potential barrier. This lens adjusts the trajectories of charged particles from different field of view positions to ensure they all approach the potential barrier at substantially the same angle, thereby eliminating position-dependent variations in energy discrimination while maintaining fine energy resolution at the center.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of operation

If conventional electron detectors are used to detect signal electrons, then detection simplicity is improved, but image contrast deteriorates due to low sensitivity to electron energies

Engineering Contradiction:
Improvedetection simplicityVSAvoidenergy sensitivity
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The detection system is segmented into multiple independent detectors, each configured to detect specific energy ranges of secondary electrons and backscattered electrons. This segmentation enables energy-discrimination detection, where different detectors capture electrons with different energy characteristics, thereby improving image contrast through energy-sensitive detection while maintaining operational simplicity through modular detector design.

Inventive Principle:
Principle #1Segmentation

3Measurement precision

If energy-angle-depending filtering is used in the energy filter, then energy filtering capability is improved, but position-depending filtering occurs that limits image contrast

Engineering Contradiction:
Improveenergy filtering capabilityVSAvoidimage contrast
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The beam-adjusting lens serves as a mediator that decouples the energy filtering function from angular dependence. By adjusting particle trajectories before they reach the potential barrier, the lens ensures that particles from different positions and angles are normalized to a common incident angle, allowing the potential barrier to perform pure energy filtering without position-dependent artifacts that would degrade image contrast.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration improves image contrast and resolution by providing fine energy-discrimination power and high uniformity over a large field of view, enabling the simultaneous detection of topography, material, and voltage contrasts, thereby enhancing the defect inspection and yield management in semiconductor manufacturing.

Implementation Method 1

a beam-adjusting lens below the grid electrode and adjusting an incident electron beam of the energy filter to become a substantially parallel beam to be incident onto the potential barrier

Methodology Applied
Scientific EffectElectrostatic lens: Electrostatic Lens

Implementation Method 2

a grid electrode being set at a first potential to form a potential barrier, while a first plurality of particles of the charged particle beam, which has initial kinetic energies higher than a specific value and thus is able to cross the potential barrier, passes through the grid electrode

Methodology Applied
Scientific EffectElectrostatic reflection: Electrostatics

Data Source

PatentUS9048063B1Electron beam apparatus
Publication Date: 2015.06.02 ASML NETHERLANDS BV
  • US9048063B1 patent drawing
  • US9048063B1 patent drawing
  • US9048063B1 patent drawing

AI summary

This invention provides a method for improving performance of a reflective type energy filter for a charged particle beam, which employs a beam-adjusting lens on an entrance side of a potential barrier of the energy filter to make the charged particle beam become a substantially parallel beam to be incident onto the potential barrier. The method makes the energy filter have both a fine energy-discrimination power over a large emission angle spread and a high uniformity of energy-discrimination powers over a large FOV. A LVSEM using this method in the energy filter can obviously improve image contrast. The invention also provides multiple energy-discrimination detection devices formed by using the advantages of the method.