Reflective Plate Exposure Apparatus for Photo-resist Patterning

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Solution Overview

Problem

Conventional photo-lithography technologies struggle to achieve sufficient exposure of photo-resist patterns with small line spaces, leading to incomplete patterning and limited performance in electrical devices such as LCDs.

Innovation Solution

An exposure apparatus and method utilizing a mask with transparent openings and a reflective plate to direct light rays back through a transparent substrate, ensuring complete exposure of the photo-resist layer, with the reflective plate being parallel to the photo-resist layer and potentially featuring convex or concave structures for enhanced reflection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the line space of the photo-resist pattern is reduced to promote electrical device performance, then the transmittance of the photo-resist decreases, but the exposure completeness deteriorates

Engineering Contradiction:
Improveelectrical device performanceVSAvoidexposure completeness
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent introduces a reflective plate positioned below the transparent substrate to reflect light rays back through the photo-resist layer from the opposite direction. This transforms the single-direction exposure into a multi-directional exposure process, allowing light to traverse the photo-resist twice (once from above through the mask, and again from below after reflection), thereby achieving complete exposure even when line spaces are reduced

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The reflective plate ensures that light rays that passed through the transparent substrate without contributing to exposure are redirected back through the photo-resist layer. This continues the useful action of light exposure rather than allowing the light to be wasted, maximizing the exposure effectiveness and ensuring complete patterning

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution ensures complete exposure of the photo-resist layer, reducing line spaces and improving the performance of electrical devices by preventing insufficient exposure due to small line spaces or high depth-to-width ratios.

Implementation Method 1

a reflective plate disposed at an opposite side of the photo-resist layer for reflecting the light rays passing through the photo-resist layer and the transparent substrate back to the photo-resist layer

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS9383650B2Exposure apparatus and exposure method
Publication Date: 2016.07.05 TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD
  • US9383650B2 patent drawing
  • US9383650B2 patent drawing
  • US9383650B2 patent drawing

AI summary

The present invention provides an exposure apparatus and an exposure method. The method comprises: utilizing an exposure light source to provide light rays to the photo-resist layer; and utilizing a reflective plate to reflect the light rays passing through the photo-resist layer and the transparent substrate back to the photo-resist layer. The present invention can reduce a line space of a pattern of the photo-resist layer.