Reflective Layer Layout for LED Transfer Misalignment Detection

The patent applies preliminary action by forming a measurer pattern on the TFT substrate before transferring the LED chips. This measurer serves as a reference that is prepared in advance, allowing alignment verification to be performed during the transfer process itself rather than after completion, thus enabling real-time correction while maintaining bulk transfer efficiency

The patent replaces mechanical alignment verification methods with optical detection. The measurer pattern reflects light from LED chips during transfer, enabling non-contact optical measurement of alignment accuracy. This substitution allows for precise alignment detection without interfering with the mechanical transfer process, resolving the contradiction between transfer efficiency and alignment precision

The patent introduces an intermediary measurer pattern that facilitates alignment detection during the transfer process. This measurer acts as a mediator between the LED chips and the alignment verification system, enabling real-time detection without requiring complex post-transfer inspection equipment. The measurer pattern is simple in structure but enables timely alignment verification, reducing process time while maintaining low device complexity

The measurer pattern on the TFT substrate performs self-service by providing its own alignment reference function. Instead of requiring external complex detection systems, the measurer itself serves as the alignment reference that LED chips can be verified against during transfer. This self-service approach enables timely defect detection with minimal additional system complexity