Deformation Detection on Reflective Metal Surfaces

The patent creates a visual copy of the deformation information by projecting structured light patterns onto the surface and capturing the reflected pattern with a camera. The camera records an image that copies the deformation data, which is then processed to highlight irregularities. This eliminates the need for the operator to directly view the raking light while preserving the ability to detect deformations through the captured and processed image data.

The patent introduces a camera and image processing system as an intermediary between the light source and the operator's eyes. Instead of the operator directly observing the light reflection patterns, the camera captures the reflected light pattern and the processing unit enhances the visualization of deformations. This intermediary system transfers the deformation detection function from direct human observation to an automated optical-mechanical system.

The patent employs dynamic control of the light source intensity, allowing the illumination system to adjust its output based on operational requirements. The microcontroller unit can modulate the LED brightness to provide sufficient illumination intensity for effective deformation detection while managing power consumption. This dynamic adjustment enables the portable device to maintain adequate light output without requiring oversized or high-power fixed illumination systems.

The patent combines multiple functions into a single integrated portable unit: the lighting system, camera, processing unit, and power supply are merged into one device. This integration allows the device to be self-contained and portable while maintaining sufficient illumination capability through efficient use of LED technology and power management. The combined system eliminates the need for separate heavy-duty lighting equipment.

The patent applies structured light patterns (such as grids or lines) only to specific regions of the surface being inspected, rather than illuminating the entire surface uniformly. The camera captures only the relevant reflected patterns from the area of interest. This localized approach enhances deformation detection precision in the inspected region while minimizing the complexity of the overall optical system, as only the necessary portion of the surface requires structured illumination.

The patent replaces complex mechanical optical systems with electronic control and digital image processing. Instead of using mechanically complex optical components to create and analyze light patterns, the system uses electronically controlled LEDs to project patterns and a camera with digital image processing to analyze the reflected patterns. The microcontroller unit coordinates the lighting and imaging, substituting mechanical complexity with electronic control and software-based pattern recognition.