Registration Pattern Spacing for Image-Forming Device Position Detection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing image-forming devices struggle to accurately detect the position of colored marks due to interference from differences in reflection characteristics, leading to registration errors and requiring longer registration patterns to compensate, which increases detection time.

Innovation Solution

The device employs a registration pattern with marks of varying colors and light reflectances, where the distance between the black mark and adjacent marks is greater than the distance between chromatic marks, and the overall pattern is designed to minimize interference between light reception waveforms, allowing for accurate detection without lengthening the pattern.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the distance between each colored mark is increased to reduce interference between light reception waveforms, then measurement precision is improved, but the overall length of the registration pattern increases and detection time increases

Engineering Contradiction:
Improveposition detection accuracyVSAvoiddetection time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies local quality by differentiating the spacing between marks based on their color and reflectance characteristics. Specifically, larger distances are set between marks with similar reflectance (e.g., yellow and cyan) to reduce waveform interference, while smaller distances are acceptable between marks with dissimilar reflectance. This localized adjustment of spacing optimizes detection accuracy without uniformly increasing the overall pattern length.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the parameter of mark spacing dynamically based on the reflectance characteristics of adjacent marks. By calculating reflectance differences and adjusting distances accordingly, the system optimizes the balance between reducing waveform interference and minimizing detection time. This parameter-based approach allows precise control over detection accuracy while maintaining efficient calibration speed.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If the registration pattern length is increased to accommodate larger distances between marks, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveposition detection accuracyVSAvoidpattern design complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent systematically adjusts the spacing parameter between marks based on quantifiable reflectance differences. By establishing clear criteria for when to increase or maintain distances (based on reflectance similarity), the pattern design becomes more structured and less arbitrary, reducing design complexity while maintaining high measurement precision.

Inventive Principle:
Principle #35Parameter changes

3Device complexity

If uniform distance is maintained between all marks, then device complexity is reduced, but measurement precision deteriorates due to waveform interference between marks with similar reflectance

Engineering Contradiction:
Improvepattern design simplicityVSAvoidposition detection accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent replaces the uniform distance approach with a localized quality approach where spacing is tailored to the specific reflectance characteristics of adjacent marks. This ensures that marks with similar reflectance (prone to waveform interference) are spaced farther apart, while marks with dissimilar reflectance can be closer, thereby improving measurement precision without excessive complexity increase.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enables precise detection of mark positions, reduces registration pattern length, and speeds up the calibration process by minimizing waveform interference, thus improving registration accuracy and efficiency.

Implementation Method 1

a light-emitting element for irradiating light onto a portion of the belt positioned within a prescribed detection region, and a light-receiving element for receiving light reflected from the detection region

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS7830403B2Image-forming device
Publication Date: 2010.11.09 BROTHER KOGYO KK
  • US7830403B2 patent drawing
  • US7830403B2 patent drawing
  • US7830403B2 patent drawing

AI summary

An image-forming device includes a conveying unit and a pattern data generating unit. The conveying unit conveys a target in a conveying direction, the target having a target light reflectance. The pattern data generating unit generates pattern data indicating a pattern in which a plurality of marks is arranged in the conveying direction. The plurality of marks includes a first mark having a first color and a first light reflectance and a plurality of second marks having a plurality of second colors and a plurality of second light reflectance. The plurality of second colors is equal to or different from one another. The plurality of second light reflectance is equal to or different from one another. A first difference between the target light reflectance and the first light reflectance is greater than a second difference between the target light reflectance and any of the plurality of second light reflectance. At least one of first distances between the first mark and the marks adjacent to the first mark is greater than a minimum distance between the adjacent second marks.