Relay-Free Test Circuit for High-Speed Functional and Parametric Testing
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Solution Overview
Problem
Existing testing apparatuses face challenges in efficiently performing both functional and parametric tests on devices under test due to parasitic capacitances from relays, which disrupt high-speed pulse signal transmission.
Innovation Solution
The proposed testing apparatus integrates a measurement circuit within the pin electronics apparatus, sharing voltage generation circuits for both functional and parametric tests, and eliminates relays to reduce parasitic capacitances, allowing simultaneous performance of functional and parametric tests without disrupting high-speed pulse signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If relays are used to switch between functional and parametric tests, then test versatility is improved, but parasitic capacitances increase causing signal deterioration
Solution Approach 1:
The patent removes relays from the testing circuit configuration, extracting the harmful component that causes parasitic capacitances. By eliminating relays entirely and using direct electrical connections between test signal generators and devices under test, the patent achieves both functional and parametric testing capabilities without the signal deterioration that would result from relay switching.
Solution Approach 2:
The patent creates a universal testing circuit that can perform both functional tests and parametric tests using the same basic circuit architecture without requiring separate relay-based switching systems. The measurement circuit shares voltage generation circuits with the test signal generator, allowing a single integrated system to handle multiple test types.
2Measurement precision
If separate testing circuits are used for functional and parametric tests, then test accuracy is improved, but device complexity increases
Solution Approach 1:
The patent merges the functional test signal generation and parametric measurement capabilities into a single integrated circuit. The measurement circuit shares voltage generation circuits with the test signal generator, combining what would traditionally be separate testing circuits into one unified system that maintains accuracy for both test types.
Solution Approach 2:
The testing circuit is designed as a universal platform where the same voltage generation and measurement infrastructure supports both functional testing and parametric characterization. This multi-functional design eliminates the need for separate dedicated circuits for each test type, reducing overall complexity while preserving measurement precision.
3Ease of operation
If relays are used for test switching, then operational flexibility is improved, but signal transmission quality deteriorates
Solution Approach 1:
The patent extracts and removes relays from the signal path, eliminating the source of parasitic capacitances that cause signal deterioration. By using direct electrical connections that bypass relay switches, the patent maintains operational flexibility for switching between test modes while ensuring high signal transmission quality without relay-induced interference.
Solution Approach 2:
The patent replaces the mechanical relay switching system with an electrical switching approach using semiconductor switches or direct connections. This substitution eliminates the mechanical components that introduce parasitic capacitances and signal deterioration, while maintaining the operational flexibility needed for switching between functional and parametric tests.
Data Source
AI summary
Provided is a testing circuit including a measurement circuit which generates an output voltage and performs a voltage application current measurement test of a device under test by using the output voltage, a pulse generation circuit which generates a pulse signal by using the output voltage of the measurement circuit in a functional test of a device under test to supply the pulse signal to a terminal of a device under test and causes the output voltage of the measurement circuit to pass therethrough in the voltage application current measurement test to supply the output voltage to a terminal of a device under test as a test voltage, and an output end feedback line which is connected to an output end side of the pulse generation circuit and feeds back a voltage on the output end side to the measurement circuit.