Relay-Based Power Supply Switching for Voltage Variation Simulation
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Solution Overview
Problem
Conventional automatic testing equipment (ATE) cannot accurately simulate voltage variations in power supply, leading to ineffective screening of problematic devices, particularly memory chips, as it provides a stable power supply that does not reflect real-world conditions.
Innovation Solution
A functional test equipment with a relay system and a pair of power supplies that apply different supply voltages to a device under test, simulating real-world voltage variations and including a microcontroller to control the durations of these variations, along with a power management capacitor to maintain power during relay switch state changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional ATE provides a stable power supply to the device under test, then the testing process is simple and reliable, but it cannot accurately simulate real-world voltage variations leading to ineffective screening of problematic devices
Solution Approach 1:
The power supply system is segmented into multiple independent power supplies (first power supply and second power supply) with different voltage levels. Each power supply can be independently controlled and switched to the device under test through relay switches, enabling simulation of different voltage conditions without requiring a single complex variable power supply.
Solution Approach 2:
Relay switches are introduced as intermediary components between the power supplies and the device under test. These relays enable rapid switching between different voltage levels by making or breaking electrical connections, allowing the system to simulate voltage variations without directly modifying the power supply circuits themselves.
2Adaptability or versatility
If multiple power supplies with different voltages are used to simulate voltage variations, then real-world conditions are accurately simulated, but the system complexity and control difficulty increase
Solution Approach 1:
The system employs dynamic switching capabilities where relay switches can rapidly transition between different power supply connections based on test requirements. This dynamic reconfiguration allows the same hardware setup to simulate various voltage scenarios (normal operation, brownout conditions, voltage spikes) without physical reconfiguration.
Solution Approach 2:
The relay system serves multiple functions: it switches between normal voltage and brownout voltage, controls timing sequences for voltage transitions, and enables different test scenarios using the same hardware infrastructure. This multi-functionality reduces the need for separate dedicated circuits for each test condition.
3Reliability
If voltage variations are applied continuously to test device robustness, then comprehensive testing is achieved, but the testing time increases significantly
Solution Approach 1:
The testing methodology employs periodic application of voltage variations rather than continuous exposure. The system applies normal voltage for extended periods and brownout voltage for shorter, controlled intervals, creating a periodic test pattern that comprehensively verifies device robustness while minimizing total test time through efficient use of both voltage states.
Solution Approach 2:
The system performs preliminary characterization by applying voltage variations in controlled sequences before final validation. By pre-testing with standardized voltage transition patterns and timing sequences, the system can quickly identify problematic devices without requiring exhaustive prolonged testing of all units.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This setup allows for a more realistic simulation of power supply conditions, effectively identifying and verifying the robustness of memory chips by simulating abrupt voltage drops and increases, enhancing the testing efficiency and accuracy.
Implementation Method 1
the relay system comprises a relay switch and a magnetizing coil magnetically coupled to the relay switch
Implementation Method 2
the power management capacitor is charged by the first supply voltage when the relay system couples the first power supply to the device under test, the power management capacitor is charged by the second supply voltage when the relay system couples the second power supply to the device under test, and the power management capacitor discharges to power the device under test
Data Source
AI summary
The present disclosure provides functional test equipment for a device under test and method of testing the device under test. The functional test equipment includes a first power supply, a second power supply and a relay system. The first power supply is configured to generate a first supply voltage. The second power supply is configured to generate a second supply voltage different from the first supply voltage. The relay system is configured to electrically couple the first power supply or the second power supply to the device under test, wherein the first supply voltage is applied to the device under test for a first duration and the second supply voltage is applied to the device under test for a second duration less than the first duration.