Reliability Parameter Determination for New Technical Systems
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Solution Overview
Problem
Determining the reliability parameter, such as failure rate, of a new technical system is challenging without individual failure information of its devices, especially for complex systems like voltage switchgears, where lifetime tests are time-consuming and expensive, and analyzing entire failing systems is technically demanding.
Innovation Solution
A method to determine failure rates of device types in new technical systems based on assigned failure parameters of known systems, using the Additive Hazard Model to calculate failure rates β1 to βk without requiring individual failure information, and subsequently determining the reliability parameter of the new system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If lifetime tests are performed on individual devices to evaluate failure behavior, then reliability information can be obtained, but the process becomes time-consuming and expensive
Solution Approach 1:
The patent uses system-level failure data from m known technical systems as a substitute for individual device testing. By analyzing aggregated failure information at the system level and using mathematical models to derive device-level failure rates, the method avoids the need for time-consuming lifetime tests on individual devices while still obtaining reliable failure rate information.
Solution Approach 2:
The patent introduces mathematical models and algorithms as intermediaries between system-level failure data and device-level reliability parameters. These models act as a bridge that transforms aggregated system failure information into actionable device failure rates without requiring direct measurement of individual device lifetimes.
2Reliability
If lifetime tests are performed on individual devices to evaluate failure behavior, then reliable failure information can be obtained, but the cost increases significantly
Solution Approach 1:
The patent replaces expensive individual device lifetime tests with analysis of system-level failure data. By using aggregated failure information from multiple known technical systems and applying mathematical models, the method obtains device failure rates at a fraction of the cost of traditional testing approaches.
Solution Approach 2:
The patent enables failure rate determination using existing system failure data that is already collected during normal operation or qualification testing. The method extracts valuable reliability information from data that would otherwise be discarded, eliminating the need for separate expensive testing programs.
3Loss of information
If entire failing systems are analyzed to find which device caused failure, then individual device failure information can be obtained, but the process becomes technically demanding and expensive
Solution Approach 1:
Instead of analyzing failing systems to find individual device failures (bottom-up approach), the patent inverts the approach by using system-level failure data to infer device-level failure rates (top-down approach). This mathematical inversion avoids the technical complexity of dissecting and analyzing complex failing systems while still obtaining the desired device reliability information.
Solution Approach 2:
The patent introduces mathematical models as intermediaries that directly connect system-level failure data to device-level failure rates, bypassing the need for complex technical analysis of failing systems. These models simplify the extraction of individual device failure information from aggregated system data.
Data Source
AI summary
A method for determining a reliability parameter of a new technical system based on assigned failure parameters of m known technical systems is provided, wherein the new technical system comprises n1 devices of a first type, n2 devices of a second type, . . . , and nk devices of a k-th type; an i-th known technical system out of the m known technical systems, with 1≤i≤m, has an assigned failure parameter pi and comprises ni1 devices of the first type, ni2 devices of the second type, . . . , and nik devices of the k-th type; and individual failure information relating to the devices of the first to k-th type is initially unknown.