Remote ADC Calibration Using Cloud Correction Coefficients
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Solution Overview
Problem
The calibration of integrated circuits, particularly analog-to-digital converters, requires skilled personnel and occupies valuable space, leading to increased costs and complexity, especially in high-speed applications where reference settling errors can occur, necessitating accurate and precise calibration methods.
Innovation Solution
A remote calibration system that utilizes a network to connect devices with integrated circuits, allowing for remote diagnosis and correction of operational deficiencies using neural network models and calibration modules, reducing the need for on-chip assistive circuitry and enabling calibration without a technician, by processing operational data to generate and transmit correction coefficients.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If on-chip assistive circuitry is added to facilitate calibration, then calibration accuracy is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent extracts the complex calibration assistive circuitry from the on-chip environment and relocates it to an external calibration system. The on-chip ADC retains only minimal calibration interfaces, while the sophisticated calibration logic, histogram analysis, and correction coefficient generation are performed externally, thereby reducing on-chip complexity while maintaining calibration accuracy.
Solution Approach 2:
The patent introduces an intermediary calibration system that acts as a bridge between the simple on-chip ADC and the complex calibration requirements. This intermediary system performs the sophisticated calibration processing externally and communicates only essential correction data back to the ADC, eliminating the need for complex on-chip calibration circuitry.
2Measurement precision
If on-chip assistive circuitry is added to facilitate calibration, then calibration capability is improved, but manufacturing cost increases
Solution Approach 1:
The patent extracts the expensive calibration assistive circuitry from the on-chip ADC and places it in an external calibration system. This extraction eliminates the need to manufacture complex calibration circuitry with each ADC, significantly reducing per-unit manufacturing costs while maintaining full calibration capability through the external system.
Solution Approach 2:
The patent uses a simplified on-chip ADC design that can be mass-produced at low cost, paired with an external calibration system that can be replicated through software or standard calibration procedures. This copying approach allows the complex calibration functionality to be distributed without increasing the base manufacturing cost of the ADC itself.
3Measurement precision
If complex calibration procedures are implemented, then calibration accuracy is improved, but ease of operation deteriorates
Solution Approach 1:
The patent implements self-service calibration where the external calibration system automatically performs histogram analysis, error detection, and correction coefficient generation without requiring technician intervention. The system calibrates itself by processing its own operational data, eliminating the need for skilled personnel while maintaining high calibration accuracy.
Solution Approach 2:
The patent implements automated feedback loops where the calibration system continuously monitors ADC performance, automatically adjusts correction coefficients based on histogram analysis, and iteratively improves calibration accuracy without human intervention. This feedback mechanism simplifies operation while maintaining precision.
Data Source
AI summary
Embodiments of the present disclosure includes systems and methods for diagnosing and correcting deficiencies in operation of integrated circuits. A set of operational data of an integrated circuit is received by a network via a communication interface. A deficiency in operation of the integrated circuit is diagnosed based on the set of operational data. A correction is generated for improving operation of the integrated circuit based on the deficiency diagnosed. The correction is transmitted over the network via the communication interface to the integrated circuit.