Remote Head Input Selector for Sequential Multi-Lane RF Testing
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Solution Overview
Problem
Conventional test and measurement instruments lack sufficient input channels to fully measure multiple signal lanes of a DUT, requiring manual reconnection of cables and face challenges with RF switches that introduce errors and physical constraints.
Innovation Solution
An input selector with a multiplexer and amplifier system that allows automated selection and amplification of desired signals from a DUT, minimizing noise and reducing manual intervention by integrating calibration parameters to compensate for system effects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manual cable reconnection is used to test all signal lanes, then all lanes can be tested, but the process is error-prone and time-consuming
Solution Approach 1:
The patent introduces an RF switch matrix as an intermediary device between the DUT and measurement instrument. This switch matrix automatically routes signals from multiple lanes to the instrument, replacing manual cable reconnection and enabling automated sequential testing of all lanes without human intervention.
Solution Approach 2:
The system dynamically reconfigures the signal path by electronically switching between different lanes through the RF switch matrix. This dynamic switching capability allows the same physical connection to serve multiple lanes sequentially, eliminating the need for physical cable movement while maintaining testing flexibility.
2Extent of automation
If RF switch is used for automated testing, then automation is achieved, but de-embedding errors increase especially above 25 GHz
Solution Approach 1:
The patent performs calibration measurements before actual testing to establish baseline characteristics of the RF switch matrix. These preliminary calibration data are stored and used during testing to compensate for switch-induced errors through de-embedding algorithms, thereby maintaining measurement accuracy despite the presence of the switch.
Solution Approach 2:
The system incorporates feedback mechanisms where measurement data is continuously refined using calibration information. The measurement instrument uses stored calibration parameters to correct signals in real-time, compensating for the effects of the RF switch and improving measurement precision through iterative error correction.
3Productivity
If RF switch matrix is used for automation, then all lanes can be tested automatically, but the physical size becomes large
Solution Approach 1:
The patent combines multiple signal paths into a single measurement instrument connection through the RF switch matrix. By merging N lanes into one instrument port, the system achieves high productivity without requiring N separate instrument connections, thereby reducing the physical footprint compared to having multiple parallel measurement paths.
Solution Approach 2:
The system transitions from a spatial arrangement (multiple parallel connections) to a temporal arrangement (sequential switching). By testing lanes in time sequence rather than space, the RF switch matrix reduces physical area requirements while maintaining the capability to test all lanes, effectively trading spatial dimension for temporal dimension.
Data Source
AI summary
An input selector for electrically connecting one of a plurality of test signals from a device under test to a test and measurement instrument includes a multiplexer having multiple inputs, each of the multiple inputs coupled to a different one of the plurality of test signals from the device under test, and having an output of a selected one of the multiple inputs, and an amplifier coupled to the output of the multiplexer for amplifying the selected test signal of the device under test before being sent as an output of the input selector to the test and measurement instrument. In alternative architectures, two or more amplifiers are coupled to the plurality of test signals, and the multiplexer selects an output of one of the two amplifiers to pass to a measurement instrument for testing.