Removable Ion Source for Axial and Cross-Beam Mode Switching
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Solution Overview
Problem
Mass spectrometers with traditional ion sources face challenges in switching between axial and cross-beam ionization modes, leading to reduced sensitivity and extended downtime due to issues like electron charging and the need for hardware changes, which are problematic for both Positive and Negative Chemical Ionization techniques.
Innovation Solution
A removable ion source design incorporating a magnet assembly that can rotate between positions to accommodate both axial and cross-beam ionization modes, allowing for electron beam orientation changes without venting the instrument, utilizing a first and second electron source aligned along and orthogonal to the primary axis, respectively, and a magnet assembly that can be moved to optimize magnetic containment and reduce electron spread.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If traditional ion sources are used with fixed electron beam orientation, then hardware structure is simple, but switching between axial and cross-beam ionization modes requires venting the instrument and changing hardware, leading to extended downtime and reduced sensitivity
Solution Approach 1:
The electron beam orientation is made dynamic through a rotatable electron source assembly that can switch between axial and cross-beam configurations. The magnet assembly is also made movable to reposition magnetic poles according to the selected ionization mode, enabling seamless transition without venting the instrument.
Solution Approach 2:
The ion source is designed with multi-functionality to perform both axial electron impact ionization and cross-beam chemical ionization using the same hardware platform. The electron source, magnet assembly, and ionization chamber work together in multiple configurations, eliminating the need for separate hardware for different ionization modes.
2Adaptability or versatility
If traditional ion sources are used with fixed electron beam orientation, then hardware structure is simple, but switching between ionization modes causes electron charging issues and reduced sensitivity
Solution Approach 1:
The system dynamically adjusts the electron beam orientation and magnetic field configuration based on the selected ionization mode. The movable magnet assembly repositions magnetic poles to provide optimal magnetic containment for each mode, preventing electron charging issues and maintaining sensitivity.
Solution Approach 2:
The magnet assembly acts as an intermediary that mediates between the electron source and the ionization chamber. By positioning magnetic poles appropriately, it controls electron trajectories and contains electron clouds, preventing harmful electron charging effects while enabling both axial and cross-beam ionization modes with high reliability.
3Reliability
If electron beam spread is not controlled, then device structure is simple, but sensitivity is reduced due to electron charging and poor magnetic containment
Solution Approach 1:
The magnet assembly is segmented into multiple movable magnetic poles that can be independently positioned. This segmentation allows precise control over magnetic field distribution and electron containment, improving sensitivity by reducing electron beam spread while keeping the overall device structure manageable through modular design.
Solution Approach 2:
The magnet assembly is made movable to dynamically reconfigure magnetic field patterns according to the ionization mode. This dynamic adjustment optimizes magnetic containment for each mode, controlling electron beam spread and enhancing sensitivity without requiring a permanently complex magnetic structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enhances sensitivity and reduces downtime by enabling seamless switching between ionization modes without the need to vent the instrument, maintaining high sensitivity for both electron ionization and chemical ionization techniques.
Implementation Method 1
The first electron source can be aligned along the primary axis of the ionization assembly and can be configured to provide an electron beam parallel to the primary axis
Implementation Method 2
The second electron source can be adjacent to the ionization assembly and can be configured to provide an electron beam orthogonal to the primary axis
Implementation Method 3
The magnet assembly can include a first magnet and a second magnet. The magnet assembly can be movable between a first position in which the first magnet is aligned with the first electron source and a second position in which the second magnet is aligned with the second electron source
Data Source
AI summary
An ion source including an ionization assembly, first and second electron sources, and a magnet assembly. The ionization assembly includes an ionization chamber and at least one ion lens. The ionization assembly has a primary axis defined by the direction of an ion beam exiting the ionization assembly and the ionization chamber and the at least one ion lens are arranged along the primary axis. The first electron source is aligned along the primary axis of the ionization assembly and is configured to provide an electron beam parallel to the primary axis. The second electron source is adjacent to the ionization assembly and is configured to provide an electron beam orthogonal to the primary axis. The magnet assembly includes a magnet. The magnet assembly is movable between a first position in which the magnet is aligned with the first electron source and a second position in which the magnet is aligned with the second electron source.