Removable Test Circuit for NV-DIMM Backup Power Validation
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Solution Overview
Problem
Current computing and data storage systems face challenges in efficiently managing backup power supplies for multiple nodes during primary power supply removal, as existing solutions often require separate backup power sources for each node, which can be inefficient and costly, and lack effective testing methods to validate backup power systems and optimize data transfer during power loss scenarios.
Innovation Solution
A system and method that provide a shared backup power supply for multiple nodes, utilizing a battery module and backup power control module to selectively distribute power, along with a removable test and diagnostics circuit that simulates power loss to validate system design, efficiency, and data transfer capabilities, allowing for parallel power delivery to nodes and optimizing data transfer from cache to non-volatile memory.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate backup power sources are provided for each node, then reliability of backup power is improved, but device complexity and cost increase
Solution Approach 1:
The patent merges multiple backup power sources into a single shared backup power supply that can serve multiple nodes. The power multiplexer dynamically routes power from this shared source to different nodes as needed, eliminating the need for separate backup sources at each node while maintaining backup power reliability.
Solution Approach 2:
The shared backup power supply is designed to serve multiple functions and multiple nodes universally. Through the power multiplexer, a single backup power source can dynamically support any combination of nodes requiring backup power, making the system versatile and adaptable to different failure scenarios.
2Device complexity
If a shared backup power supply is used for multiple nodes, then device complexity is reduced, but reliability of backup power may worsen
Solution Approach 1:
The power multiplexer acts as an intermediary between the shared backup power supply and multiple nodes. It intelligently manages power distribution, ensuring that when primary power fails, the backup power is efficiently routed to the appropriate nodes, thereby maintaining reliability despite the shared architecture.
Solution Approach 2:
The system employs dynamic power routing through the power multiplexer, which can adaptively switch and allocate backup power to different nodes based on real-time failure conditions. This dynamic capability ensures that the shared backup power supply can reliably support various node combinations as failures occur.
3Reliability
If testing methods are added to validate backup power systems, then reliability is improved, but device complexity increases
Solution Approach 1:
The test and diagnostics circuit performs preliminary validation of the backup power system before actual failures occur. By pre-testing power delivery paths and backup switching mechanisms, the system ensures reliability is verified in advance, reducing the need for complex ongoing monitoring during operational failures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables efficient and reliable backup power distribution to multiple nodes, reduces design risks, and optimizes data transfer by validating system performance under simulated power loss scenarios, thereby ensuring timely and efficient data migration during primary power supply failures.
Implementation Method 1
The power system can include a battery module and a backup power controller module
Data Source
AI summary
A test and diagnostics circuit, methods and systems are described. An example test and diagnostics circuit includes a controller and a power monitor coupled to the controller. A load switch on the test and diagnostics circuit selectably implements a load from among multiple load values to test a computing and/or data storage system. The test and diagnostics circuit includes circuitry connecting the controller, the power monitor and the load switch to receive a test enable signal from a non-dedicated pin in a non-volatile dual inline memory module (NV-DIMM) slot to implement a test operation on the system.