Removable Test Point Portions for High-Density Circuit Boards
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Solution Overview
Problem
Conventional circuit boards face limitations in miniaturization and component density due to the occupation of valuable space by test points, and existing testing platforms are either expensive, inflexible, or limited to testing specific types of boards.
Innovation Solution
The development of circuit boards with removable test node portions that maximize end-use functional efficiency and configurable testing platforms capable of accommodating different types and sizes of circuit boards, utilizing side-mounted test points for consistent alignment and electrical configuration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If test points are included in conventional circuit boards, then testing capability is provided, but board space is occupied limiting component density
Solution Approach 1:
The circuit board is divided into a functional portion and a removable test portion. The functional portion contains electronic components for end-use purposes, while the removable test portion contains test points for testing. This segmentation allows both testing capability and high component density in the functional portion to coexist.
Solution Approach 2:
Test points are extracted from the functional portion and placed in a separate removable test portion. This extraction eliminates the conflict between test point space occupation and component density, as test points are now located in a dedicated area that can be removed after testing.
2Measurement precision
If custom-made testing platforms are used for specific circuit boards, then testing accuracy is improved, but manufacturing cost increases and versatility is reduced
Solution Approach 1:
The testing platform is designed with a standardized interface that can accommodate multiple circuit board types. The removable test portions are designed with consistent test point arrangements that interface with the universal testing platform, allowing one platform to test various board configurations without custom modifications.
Solution Approach 2:
The testing platform allows for configurable parameters such as probe positions and test sequences to be adjusted based on the specific circuit board being tested. This configurability maintains testing accuracy for different board types while using a single universal platform.
3Adaptability or versatility
If robotic testing platforms are used, then flexibility is improved, but device complexity and cost increase
Solution Approach 1:
Instead of using complex robotic systems that physically move probes, the solution changes the parameter of test point location to standardized positions on removable portions. This allows a simpler, fixed probe array to achieve the same flexibility by interfacing with different removable test portions designed for various board types.
Data Source
AI summary
Circuit boards are provided that include a functional portion and at least one removable test point portion. The removable test point portion may include test points which are accessed to verify whether the functional portion is operating properly or whether installed electronic components are electrically coupled to the board. If multiple boards are manufactured together on a single panel (in which the individual boards are broken off), the test points can be placed on bridges (e.g., removable portions) that connect the individual boards together during manufacturing and testing. Configurable test boards are also provided that can be adjusted to accommodate circuit boards of different size and electrical testing requirements. Methods and systems for testing these circuit boards are also provided.