Reserved Memory Cells for Defect Position Error Correction

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Solution Overview

Problem

Non-volatile memory systems face challenges in identifying and managing defective data storage cells, which can lead to distorted information and reduced reliability due to manufacturing errors or wear and tear, limiting the effectiveness of error correction mechanisms.

Innovation Solution

The use of reserved or 'pilot' cells to identify and mark defective data storage cells, allowing for the exclusion of defective cell data during read and write operations, thereby enhancing error correction capabilities without requiring additional circuitry or resources.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If error correction codes and defect management schemes are used to recover information from defective cells, then data reliability is improved, but device complexity and processing overhead increase

Engineering Contradiction:
Improvedata reliabilityVSAvoidprocessing overhead
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by pre-marking defective cell positions during manufacturing or initial characterization, storing this defect map in reserved cells before normal data operations begin. This allows the system to proactively avoid defective cells rather than reacting to errors during read/write operations, reducing the complexity of real-time error correction processing.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent extracts defective cell position information from the main data storage functionality and separates it into dedicated reserved cells. By taking out the defect management function from regular data cells and placing it in specialized reserved cells, the system simplifies the overall processing overhead while maintaining reliability.

Inventive Principle:
Principle #2Taking out (Extraction)

2Reliability

If reserved cells are used to store defect position information, then error correction capability is improved, but storage capacity is reduced

Engineering Contradiction:
Improveerror correction capabilityVSAvoidstorage capacity
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent applies multi-functionality by designing reserved cells that serve dual purposes: they provide reference voltages/currents for multi-bit data storage operations and simultaneously store defect position information. This universal use of reserved cells maximizes their utility while minimizing the impact on overall storage capacity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent changes the functional parameter of reserved cells from solely providing reference signals to also encoding defect position information. By modifying what parameters these cells store (from only voltage reference levels to including defect status bits), the system achieves improved error correction without requiring additional dedicated defect storage cells.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If defective cells are identified and avoided, then data distortion is reduced, but manufacturing yield and cell utilization decrease

Engineering Contradiction:
Improvedata distortionVSAvoidcell utilization
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies local quality by allowing different regions of the memory array to have different functional characteristics. Cells identified as defective are locally marked in reserved cells, enabling the system to maintain high utilization of good cells while isolating and avoiding only the specific defective locations, rather than reducing overall array utilization.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent uses reserved cells as copies or proxies that store defect position information without affecting the actual data storage function of the main array. By copying defect status into these reference cells, the system can track and avoid defective cells while maintaining full utilization of the primary storage array.

Inventive Principle:
Principle #26Copying

Data Source

PatentUS8117510B1Circuits, architectures, apparatuses, systems, methods, algorithms, software and firmware for using reserved cells to indicate defect positions
Publication Date: 2012.02.14 MARVELL ASIA PTE LTD
  • US8117510B1 patent drawing
  • US8117510B1 patent drawing
  • US8117510B1 patent drawing

AI summary

A circuit including a memory and an error correction code circuit. The memory including (i) a plurality of data storage cells and (ii) at least one reserved cell configured to store status information identifying a status of one or more of the plurality of data storage cells. Each of the data storage cells is configured to store a plurality of data bits. Each of the at least one reserved cell includes a multi-bit cell configured to store a lower density of information than each of the data storage cells. The error correction code circuit is configured to indicate, in a data stream formed from the memory, positions of data from the data storage cells for which status information is stored.