Resin Composition for Semiconductor Resist Exposure Latitude

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Solution Overview

Problem

The existing chemically amplified resist compositions used in semiconductor manufacturing lack sufficient exposure latitude, which is crucial for precise pattern formation in microfabrication processes.

Innovation Solution

An actinic ray-sensitive or radiation-sensitive resin composition is developed, incorporating a resin with a specific structure represented by General Formula (1), which includes a repeating unit capable of increasing polarity upon acid action, along with a photoacid generator, to enhance exposure latitude and pattern formation accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a resist composition with a maleimido group is used, then the polarity increases upon acid decomposition, but the exposure latitude becomes insufficient

Engineering Contradiction:
Improvepattern formation precisionVSAvoidexposure latitude
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent changes the chemical structure parameters of the resin by introducing a specific repeating unit with a nitrogen-containing six-membered ring and a carbonyl group, which modifies the acid-base characteristics and polarity changes during decomposition, thereby improving both exposure latitude and pattern formation precision

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent creates a composite resist composition by combining the specifically structured resin with a photoacid generator and other components, where the interaction between these components produces the desired balance of exposure latitude and manufacturing precision

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The new resin composition achieves excellent exposure latitude, preventing acid diffusion into unexposed areas and improving the precision of pattern formation, thereby enhancing the manufacturing process for electronic devices.

Implementation Method 1

a photoacid generator, to enhance exposure latitude and pattern formation accuracy

Methodology Applied
Scientific EffectPhotoacid generation: Photopolymerisation

Implementation Method 2

a resin including a repeating unit represented by General Formula (1) and capable of increasing a polarity by an action of an acid

Methodology Applied
Scientific EffectPolarity increase upon acid decomposition: Chemical Bonding

Data Source

PatentUS12007688B2Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, method for manufacturing electronic device, and resin
Publication Date: 2024.06.11 FUJIFILM CORP
  • US12007688B2 patent drawing
  • US12007688B2 patent drawing
  • US12007688B2 patent drawing

AI summary

An actinic ray-sensitive or radiation-sensitive resin composition includes a resin including a repeating unit represented by Formula (1) and capable of increasing a polarity by an action of an acid.