Resistive Switching PUF Generation via High Side Programming

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Solution Overview

Problem

Current resistive-switching memory technologies face challenges in generating reliable and unique identifiers for semiconductor chips, as existing methods often result in high bit error rates and are vulnerable to illicit side-channel access due to correlations among devices.

Innovation Solution

The use of resistive switching devices to generate physical unclonable feature (PUF) data by leveraging stochastic characteristics such as native leak currents, which are digitized and used to create a distinct identifier sequence, with a one-time programmable process to ensure longevity and reliability across various conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional identifier generation methods are used in resistive-switching memory, then manufacturing simplicity is maintained, but bit error rate increases and reliability decreases

Engineering Contradiction:
Improveidentifier reliabilityVSAvoidbit error rate
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent applies parameter changes by utilizing the natural variability in resistive switching characteristics (such as leakage current, switching voltage, and resistance values) of individually fabricated resistive switching devices. These parameter variations, which would normally be considered manufacturing imperfections, are deliberately harnessed to create unique identifier sequences. By measuring and digitizing these inherent parameter differences across multiple devices, the system generates reliable identifiers with low bit error rates, transforming manufacturing variability into a security advantage.

Inventive Principle:
Principle #35Parameter changes

2Object-affected harmful factors

If correlated devices are used for identifier generation, then device simplicity is maintained, but vulnerability to side-channel access increases

Engineering Contradiction:
Improveside-channel vulnerabilityVSAvoiddevice correlation structure
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent extracts and utilizes the unique, uncorrelated characteristics of individual resistive switching devices to generate identifier sequences. By measuring parameters such as leakage current, switching voltage, and resistance values from multiple independently fabricated devices, the system extracts unique identifiers that are not correlated with each other. This extraction approach ensures that each device contributes independent entropy to the identifier, making the system resistant to side-channel attacks while maintaining relative device simplicity.

Inventive Principle:
Principle #2Taking out (Extraction)

3Reliability

If native characteristics are used directly for PUF generation, then process simplicity is maintained, but longevity and reliability under varying conditions decrease

Engineering Contradiction:
Improvelongevity across conditionsVSAvoidPUF formation process complexity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent applies preliminary action by performing a one-time programmable (OTP) process on selected resistive switching devices after their native characteristics are measured. Devices that exhibit suitable characteristics for PUF generation are programmed with unique identifier data during this preliminary step. This OTP programming ensures that the identifier data is permanently stored and will maintain its integrity over the device's lifetime, even under varying operating conditions such as temperature changes, voltage fluctuations, and aging effects, thereby ensuring long-term reliability.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach achieves low bit error rates and high entropy, making the identifier sequences highly unique and resistant to illicit access, while maintaining reliability over multiple read cycles and varying conditions.

Implementation Method 1

leveraging stochastic characteristics such as native leak currents, which are digitized and used to create a distinct identifier sequence

Methodology Applied
Scientific EffectNative leak current: Electrical Resistance

Data Source

PatentUS11823739B2Physically unclonable function (PUF) generation involving high side programming of bits
Publication Date: 2023.11.21 CROSSBAR INC
  • US11823739B2 patent drawing
  • US11823739B2 patent drawing
  • US11823739B2 patent drawing

AI summary

Stochastic or near-stochastic physical characteristics of resistive switching devices are utilized for generating data distinct to those resistive switching devices. The distinct data can be utilized for applications related to electronic identification. As one example, data generated from physical characteristics of resistive switching devices on a semiconductor chip can be utilized to form a distinct identifier sequence for that semiconductor chip, utilized for verification applications for communications with the semiconductor chip or utilized for generating cryptographic keys or the like for cryptographic applications.